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Publications of Author

1. Markus P. J. Mergens, Geert Wybo, Bart Keppens, Benjamin Van Camp, Frederic De Ranter, Koen G. Verhaege, John Armer, Phillip Jozwiak, Christian C. Russ
   ESD protection circuit design for ultra-sensitive IO applications in advanced sub-90nm CMOS technologies. [Citation Graph (0, 0)][DBLP]
   ISCAS (2), 2005, pp:1194-1197 [Conf]
   
2. Koen G. Verhaege
   Editorial. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2001, v:41, n:3, pp:333- [Journal]
   
3. Koen G. Verhaege, Christian C. Russ
   Novel fully silicided ballasting and MFT design techniques for ESD protection in advanced deep sub-micron CMOS technologies. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2001, v:41, n:11, pp:1739-1749 [Journal]
   
4. Koen G. Verhaege, Markus P. J. Mergens, Christian C. Russ, John Armer, Phillip Jozwiak
   Novel design of driver and ESD transistors with significantly reduced silicon area. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2002, v:42, n:1, pp:3-13 [Journal]
   
5. Markus P. J. Mergens, Christian C. Russ, Koen G. Verhaege, John Armer, Phillip Jozwiak, Russ Mohn
   High holding current SCRs (HHI-SCR) for ESD protection and latch-up immune IC operation. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2003, v:43, n:7, pp:993-1000 [Journal]
   
6. S. Trinh, Markus P. J. Mergens, Koen G. Verhaege, Christian C. Russ, John Armer, Phillip Jozwiak, Bart Keppens, Russ Mohn, G. Taylor, Frederic De Ranter
   Multi-finger turn-on circuits and design techniques for enhanced ESD performance and width scaling. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2003, v:43, n:9-11, pp:1537-1543 [Journal]
   
7. Bart Keppens, Markus P. J. Mergens, Cong Son Trinh, Christian C. Russ, Benjamin Van Camp, Koen G. Verhaege
   ESD protection solutions for high voltage technologies. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2006, v:46, n:5-6, pp:677-688 [Journal]