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Christian C. Russ :
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Markus P. J. Mergens , Geert Wybo , Bart Keppens , Benjamin Van Camp , Frederic De Ranter , Koen G. Verhaege , John Armer , Phillip Jozwiak , Christian C. Russ ESD protection circuit design for ultra-sensitive IO applications in advanced sub-90nm CMOS technologies. [Citation Graph (0, 0)][DBLP ] ISCAS (2), 2005, pp:1194-1197 [Conf ] Koen G. Verhaege , Christian C. Russ Novel fully silicided ballasting and MFT design techniques for ESD protection in advanced deep sub-micron CMOS technologies. [Citation Graph (0, 0)][DBLP ] Microelectronics Reliability, 2001, v:41, n:11, pp:1739-1749 [Journal ] Koen G. Verhaege , Markus P. J. Mergens , Christian C. Russ , John Armer , Phillip Jozwiak Novel design of driver and ESD transistors with significantly reduced silicon area. [Citation Graph (0, 0)][DBLP ] Microelectronics Reliability, 2002, v:42, n:1, pp:3-13 [Journal ] Markus P. J. Mergens , Christian C. Russ , Koen G. Verhaege , John Armer , Phillip Jozwiak , Russ Mohn High holding current SCRs (HHI-SCR) for ESD protection and latch-up immune IC operation. [Citation Graph (0, 0)][DBLP ] Microelectronics Reliability, 2003, v:43, n:7, pp:993-1000 [Journal ] S. Trinh , Markus P. J. Mergens , Koen G. Verhaege , Christian C. Russ , John Armer , Phillip Jozwiak , Bart Keppens , Russ Mohn , G. Taylor , Frederic De Ranter Multi-finger turn-on circuits and design techniques for enhanced ESD performance and width scaling. [Citation Graph (0, 0)][DBLP ] Microelectronics Reliability, 2003, v:43, n:9-11, pp:1537-1543 [Journal ] Bart Keppens , Markus P. J. Mergens , Cong Son Trinh , Christian C. Russ , Benjamin Van Camp , Koen G. Verhaege ESD protection solutions for high voltage technologies. [Citation Graph (0, 0)][DBLP ] Microelectronics Reliability, 2006, v:46, n:5-6, pp:677-688 [Journal ] Search in 0.001secs, Finished in 0.002secs