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Juin J. Liou: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Javier A. Salcedo, Juin J. Liou, Muhammad Yaqub Afridi, Allen R. Hefner
    Novel electrostatic discharge protection structure for a monolithic gas sensor systems-on-a-chip. [Citation Graph (0, 0)][DBLP]
    ISCAS (1), 2005, pp:416-419 [Conf]
  2. Xiaofang Gao, Juin J. Liou, Joe Bernier, Gregg Croft, Adelmo Ortiz-Conde
    Implementation of a comprehensive and robust MOSFET model in cadence SPICE for ESD applications. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 2002, v:21, n:12, pp:1497-1502 [Journal]
  3. W. W. Wong, Juin J. Liou
    JFET circuit simulation using SPICE implemented with an improved model. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1994, v:13, n:1, pp:105-109 [Journal]
  4. F. Schwierz, Juin J. Liou
    Semiconductor devices for RF applications: evolution and current status. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:2, pp:145-168 [Journal]
  5. Juin J. Liou, Qiang Zhang, John McMacken, J. Ross Thomson, Kevin Stiles, Paul Layman
    Statistical modeling of MOS devices for parametric yield prediction. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:4-5, pp:787-795 [Journal]
  6. Juin J. Liou, R. Shireen, Adelmo Ortiz-Conde, F. J. García Sánchez, Antonio Cerdeira, Xiaofang Gao, Xuecheng Zou, C. S. Ho
    Influence of polysilicon-gate depletion on the subthreshold behavior of submicron MOSFETs. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:3, pp:343-347 [Journal]
  7. Adelmo Ortiz-Conde, F. J. García Sánchez, Juin J. Liou, Antonio Cerdeira, Magali Estrada, Y. Yue
    A review of recent MOSFET threshold voltage extraction methods. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:4-5, pp:583-596 [Journal]
  8. Xiaofang Gao, Juin J. Liou, Joe Bernier, Gregg Croft, Waisum Wong, Satya Vishwanathan
    Optimization of on-chip ESD protection structures for minimal parasitic capacitance. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:5, pp:725-733 [Journal]
  9. C. S. Ho, Kuo-Yin Huang, Ming Tang, Juin J. Liou
    An analytical threshold voltage model of NMOSFETs with hot-carrier induced interface charge effect. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:7-8, pp:1144-1149 [Journal]
  10. Javier A. Salcedo, Juin J. Liou, Muhammad Yaqub Afridi, Allen R. Hefner
    On-chip electrostatic discharge protection for CMOS gas sensor systems-on-a-chip (SoC). [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:8, pp:1285-1294 [Journal]
  11. You-Lin Wu, Shi-Tin Lin, Tsung-Min Chang, Juin J. Liou
    Reliability study of ultrathin oxide films subject to irradiation-then-stress treatment using conductive atomic force microscopy. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2007, v:47, n:2-3, pp:419-421 [Journal]

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