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Mustapha Slamani: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Abdelouahab Djemouai, Mohamad Sawan, Mustapha Slamani
    A 200 MHz frequency-locked loop based on new frequency-to-voltage converters approach. [Citation Graph (0, 0)][DBLP]
    ISCAS (2), 1999, pp:89-92 [Conf]
  2. Abdelouahab Djemouai, Mohamad Sawan, Mustapha Slamani
    An efficient RF power transfer and bidirectional data transmission to implantable electronic devices. [Citation Graph (0, 0)][DBLP]
    ISCAS (2), 1999, pp:259-262 [Conf]
  3. Mustapha Slamani
    Testing Highly Integrated Wireless Circuits and Systems with Low Cost Tester: How to Overcome the Challenge? [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:1225- [Conf]
  4. Mustapha Slamani
    RF Test 101: Defining the Problem, Finding Solutions. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:1286- [Conf]
  5. Mustapha Slamani, Bozena Kaminska, Guy Quesnel
    An Integrated Approach for Analog Ciruit Testing with a Minmum Number of Detected Parameters. [Citation Graph (0, 0)][DBLP]
    ITC, 1994, pp:631-640 [Conf]
  6. Robert C. Aitken, Mustapha Slamani, H. Ding, William R. Eisenstadt, Sanghoon Choi, John McLaughlin
    Wireless Test. [Citation Graph (0, 0)][DBLP]
    VTS, 2002, pp:173-174 [Conf]
  7. Iboun Taimiya Sylla, Mustapha Slamani, Bozena Kaminska, Fartoumi M. Hossein, Patrick Vincent
    Impedance Mismatch and Lumped Capacitance Effects in High Frequency Testing. [Citation Graph (0, 0)][DBLP]
    VTS, 1998, pp:239-244 [Conf]
  8. Haralampos-G. D. Stratigopoulos, Petros Drineas, Mustapha Slamani, Yiorgos Makris
    Non-RF to RF Test Correlation Using Learning Machines: A Case Study. [Citation Graph (0, 0)][DBLP]
    VTS, 2007, pp:9-14 [Conf]
  9. Mustapha Slamani, Bozena Kaminska
    Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1992, v:9, n:1, pp:30-39 [Journal]
  10. Mustapha Slamani, Bozena Kaminska
    Multifrequency Analysis of Faults in Analog Circuits. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1995, v:12, n:2, pp:70-80 [Journal]
  11. Carol Stolicny, Mustapha Slamani, Fidel Muradali, Geir Eide, Mike Li
    ITC 2003 panels: Part 2. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:3, pp:175-176 [Journal]
  12. Dana Brown, John Ferrario, Randy Wolf, Jing Li, Jayendra Bhagat, Mustapha Slamani
    RF Testing on a Mixed Signal Tester. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2007, v:23, n:1, pp:85-94 [Journal]

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