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Felix Beaudoin: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Patrick Mitran, Felix Beaudoin, Mourad N. El-Gamal
    A 2.5 Gbit/s CMOS optical receiver frontend. [Citation Graph (0, 0)][DBLP]
    ISCAS (5), 2002, pp:441-444 [Conf]
  2. Romain Desplats, Felix Beaudoin, Philippe Perdu, Nagamani Nataraj, Ted Lundquist, Ketan Shah
    Fault Localization using Time Resolved Photon Emission and STIL Waveforms. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:254-263 [Conf]
  3. Romain Desplats, Felix Beaudoin, Philippe Perdu, P. Poirier, D. Trémouilles, M. Bafleur, D. Lewis
    Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:9-10, pp:1539-1544 [Journal]
  4. D. Lewis, V. Pouget, T. Beauchêne, H. Lapuyade, P. Fouillat, A. Touboul, Felix Beaudoin, Philippe Perdu
    Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:9-10, pp:1471-1476 [Journal]
  5. Romain Desplats, Philippe Perdu, Felix Beaudoin
    A New Versatile Testing Interface for Failure Analysis in Integrated Circuits. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:9-10, pp:1495-1499 [Journal]
  6. Felix Beaudoin, X. Chauffleur, J. P. Fradin, Philippe Perdu, Romain Desplats, D. Lewis
    Modeling Thermal Laser Stimulation. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:9-10, pp:1477-1482 [Journal]
  7. Felix Beaudoin, Philippe Perdu, Romain Desplats, S. Rigo, D. Lewis
    Silicon Thinning and Polishing on Packaged Devices. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:9-10, pp:1557-1561 [Journal]
  8. Felix Beaudoin, D. Carisetti, Romain Desplats, Philippe Perdu, D. Lewis, J. C. Clement
    Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:9-11, pp:1581-1585 [Journal]
  9. O. Crépel, Felix Beaudoin, L. Dantas de Morais, G. Haller, C. Goupil, Philippe Perdu, Romain Desplats, D. Lewis
    Backside Hot Spot Detection Using Liquid Crystal Microscopy. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:9-11, pp:1741-1746 [Journal]
  10. Felix Beaudoin, G. Haller, Philippe Perdu, Romain Desplats, T. Beauchêne, D. Lewis
    Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:9-11, pp:1729-1734 [Journal]
  11. B. Domengès, P. Schwindenhammer, P. Poirier, Felix Beaudoin, Ph. Descamps
    Comprehensive failure analysis of leakage faults in bipolar transistors. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:9-11, pp:1449-1452 [Journal]
  12. Felix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, G. Haller, V. Pouget, D. Lewis
    From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:9-11, pp:1681-1686 [Journal]
  13. X. Lafontan, F. Pressecq, Felix Beaudoin, S. Rigo, M. Dardalhon, J.-L. Roux, P. Schmitt, J. Kuchenbecker, B. Baradat, D. Lellouchi
    The advent of MEMS in space. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:7, pp:1061-1083 [Journal]
  14. O. Crépel, Romain Desplats, Y. Bouttement, Philippe Perdu, C. Goupil, Ph. Descamps, Felix Beaudoin, L. Marina
    Magnetic emission mapping for passive integrated components characterisation. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:9-11, pp:1809-1814 [Journal]
  15. M. Remmach, Romain Desplats, Felix Beaudoin, E. Frances, Philippe Perdu, D. Lewis
    Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:9-11, pp:1639-1644 [Journal]
  16. T. Beauchêne, D. Lewis, Felix Beaudoin, V. Pouget, Romain Desplats, P. Fouillat, Philippe Perdu, M. Bafleur, D. Trémouilles
    Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:3, pp:439-444 [Journal]
  17. D. Trémouilles, G. Bertrand, M. Bafleur, Felix Beaudoin, Philippe Perdu, N. Guitard, L. Lescouzères
    TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:1, pp:71-79 [Journal]
  18. T. Beauchêne, D. Lewis, Felix Beaudoin, V. Pouget, Philippe Perdu, P. Fouillat, Y. Danto
    A physical approach on SCOBIC investigation in VLSI. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:1, pp:173-177 [Journal]
  19. Kevin Sanchez, Romain Desplats, G. Perez, V. Pichetto, Felix Beaudoin, Philippe Perdu
    Solar Cell Analysis with Light Emission and OBIC Techniques. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:9-11, pp:1755-1760 [Journal]
  20. Romain Desplats, A. Eral, Felix Beaudoin, Philippe Perdu, Alan J. Weger, Moyra K. McManus, Peilin Song, Franco Stellari
    Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:9-11, pp:1663-1668 [Journal]
  21. Abdellatif Firiti, D. Faujour, G. Haller, J. M. Moragues, V. Goubier, Philippe Perdu, Felix Beaudoin, D. Lewis
    Short defect characterization based on TCR parameter extraction. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:9-11, pp:1563-1568 [Journal]
  22. Felix Beaudoin, Kevin Sanchez, Romain Desplats, Philippe Perdu, J. M. Nicot, J. P. Roux, M. Otte
    Dynamic Laser Stimulation Case Studies. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:9-11, pp:1538-1543 [Journal]
  23. C. De Nardi, Romain Desplats, Philippe Perdu, Felix Beaudoin, J.-L. Gauffier
    Oxide charge measurements in EEPROM devices. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:9-11, pp:1514-1519 [Journal]
  24. Abdellatif Firiti, Felix Beaudoin, G. Haller, Philippe Perdu, D. Lewis, P. Fouillat
    Impact of semiconductors material on IR Laser Stimulation signal. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:9-11, pp:1465-1470 [Journal]
  25. D. Briand, Felix Beaudoin, J. Courbat, N. F. de Rooij, Romain Desplats, Philippe Perdu
    Failure analysis of micro-heating elements suspended on thin membranes. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:9-11, pp:1786-1789 [Journal]
  26. Kevin Sanchez, Romain Desplats, Felix Beaudoin, Philippe Perdu, J. P. Roux, G. Woods, D. Lewis
    NIR laser stimulation for dynamic timing analysis. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:9-11, pp:1459-1464 [Journal]
  27. F. Essely, F. Darracq, V. Pouget, M. Remmach, Felix Beaudoin, N. Guitard, M. Bafleur, Philippe Perdu, A. Touboul, D. Lewis
    Application of various optical techniques for ESD defect localization. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2006, v:46, n:9-11, pp:1563-1568 [Journal]

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