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Edward J. Nowak :
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Kerry Bernstein , John E. Bertsch , William F. Clark , John J. Ellis-Monaghan , Larry G. Heller , Edward J. Nowak Practical performance/power alternatives within an existing CMOS technology generation. [Citation Graph (0, 0)][DBLP ] ISLPED, 1996, pp:365-370 [Conf ] Rajiv V. Joshi , Keunwoo Kim , Richard Q. Williams , Edward J. Nowak , Ching-Te Chuang A High-Performance, Low Leakage, and Stable SRAM Row-Based Back-Gate Biasing Scheme in FinFET Technology. [Citation Graph (0, 0)][DBLP ] VLSI Design, 2007, pp:665-672 [Conf ] Edward J. Nowak Maintaining the benefits of CMOS scaling when scaling bogs down. [Citation Graph (0, 0)][DBLP ] IBM Journal of Research and Development, 2002, v:46, n:2-3, pp:169-186 [Journal ] Ernest Y. Wu , Edward J. Nowak , Alex Vayshenker , Wing L. Lai , David L. Harmon CMOS scaling beyond the 100-nm node with silicon-dioxide-based gate dielectrics. [Citation Graph (0, 0)][DBLP ] IBM Journal of Research and Development, 2002, v:46, n:2-3, pp:287-298 [Journal ] Search in 0.001secs, Finished in 0.001secs