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Byungwhan Kim:
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- Byungwhan Kim, Donghwan Kim, Seung Soo Han
Prediction of Radio Frequency Impedance Matching in Plasma Equipment Using Neural Network. [Citation Graph (0, 0)][DBLP] ISNN (2), 2006, pp:1028-1035 [Conf]
- Byungwhan Kim, Sooyoun Kim, Sang Jeen Hong
Recognition of Plasma-Induced X-Ray Photoelectron Spectroscopy Fault Pattern Using Wavelet and Neural Network. [Citation Graph (0, 0)][DBLP] ISNN (2), 2006, pp:1036-1042 [Conf]
- Byungwhan Kim, Dukwoo Lee, Seung Soo Han
Prediction of Plasma Enhanced Deposition Process Using GA-Optimized GRNN. [Citation Graph (0, 0)][DBLP] ISNN (2), 2006, pp:1020-1027 [Conf]
- Byungwhan Kim, Wooram Ko, Seung Soo Han
Neural Network Recognition of Scanning Electron Microscope Image for Plasma Diagnosis. [Citation Graph (0, 0)][DBLP] PRICAI, 2006, pp:350-357 [Conf]
- Byungwhan Kim, Jae Young Park, Donghwan Kim, Seung Soo Han
Diagnosis Model of Radio Frequency Impedance Matching in Plasma Equipment by Using Neural Network and Wavelets. [Citation Graph (0, 0)][DBLP] PRICAI, 2006, pp:995-999 [Conf]
- Byungwhan Kim, Jang Hyun Park, Beom-Soo Kim
Fuzzy Logic Model of Langmuir Probe Discharge Data. [Citation Graph (0, 0)][DBLP] Computers & Chemistry, 2002, v:26, n:6, pp:573-581 [Journal]
- Byungwhan Kim, Seongjin Choi
Adaptive Network-Based Fuzzy Inference Model of Plasma Enhanced Chemical Vapor Deposition Process. [Citation Graph (0, 0)][DBLP] ISNN (1), 2007, pp:602-608 [Conf]
Modeling of Thin Film Process Data Using a Genetic Algorithm-Optimized Initial Weight of Backpropagation Neural Network. [Citation Graph (, )][DBLP]
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