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Yonsang Cho: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Yonsang Cho, Irith Pomeranz, Sudhakar M. Reddy
    Test Application Time Reduction for Scan Circuits Using Limited Scan Operations. [Citation Graph (0, 0)][DBLP]
    ISQED, 2004, pp:211-216 [Conf]
  2. Yonsang Cho, Irith Pomeranz, Sudhakar M. Reddy
    On reducing test application time for scan circuits using limited scan operations and transfer sequences. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 2005, v:24, n:10, pp:1594-1605 [Journal]

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