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Costas J. Spanos: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Paul Friedberg, Yu Cao, Jason Cain, Ruth Wang, Jan M. Rabaey, Costas J. Spanos
    Modeling Within-Die Spatial Correlation Effects for Process-Design Co-Optimization. [Citation Graph (0, 0)][DBLP]
    ISQED, 2005, pp:516-521 [Conf]
  2. Costas J. Spanos, Stephen W. Director
    Parameter Extraction for Statistical IC Process Characterization. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1986, v:5, n:1, pp:66-78 [Journal]

  3. Physically justifiable die-level modeling of spatial variation in view of systematic across wafer variability. [Citation Graph (, )][DBLP]


  4. Yield-constrained digital circuit sizing via sequential geometric programming. [Citation Graph (, )][DBLP]


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