The SCEAS System
Navigation Menu

Search the dblp DataBase


David Abercrombie: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Jay Jahangiri, David Abercrombie
    Meeting Nanometer DPM Requirements Through DFT. [Citation Graph (0, 0)][DBLP]
    ISQED, 2005, pp:276-282 [Conf]
  2. Manu Rehani, David Abercrombie, Robert Madge, Jim Teisher, Jason Saw
    ATE Data Collection - A comprehensive requirements proposal to maximize ROI of test. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:181-189 [Conf]
  3. David Turner, David Abercrombie, James McNames, W. Robert Daasch, Robert Madge
    Isolating and Removing Sources of Variation in Test Data. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:464-471 [Conf]
  4. David Abercrombie, Bernd Koenemann, Nagesh Tamarapalli, Srikanth Venkataraman
    DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 2006, pp:14- [Conf]
  5. Jay Jahangiri, David Abercrombie
    Value-Added Defect Testing Techniques. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:3, pp:224-231 [Journal]

  6. Use of lithography simulation for the calibration of equation-based design rule checks. [Citation Graph (, )][DBLP]

  7. An innovative method to automate the waiver of IP-level DRC violations. [Citation Graph (, )][DBLP]

Search in 0.002secs, Finished in 0.002secs
System may not be available sometimes or not working properly, since it is still in development with continuous upgrades
The rankings that are presented on this page should NOT be considered as formal since the citation info is incomplete in DBLP
System created by [] © 2002
for Data Engineering Laboratory, Department of Informatics, Aristotle University © 2002