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Publications of Author

1. Jay Jahangiri, David Abercrombie
   Meeting Nanometer DPM Requirements Through DFT. [Citation Graph (0, 0)][DBLP]
   ISQED, 2005, pp:276-282 [Conf]
   
2. Manu Rehani, David Abercrombie, Robert Madge, Jim Teisher, Jason Saw
   ATE Data Collection - A comprehensive requirements proposal to maximize ROI of test. [Citation Graph (0, 0)][DBLP]
   ITC, 2004, pp:181-189 [Conf]
   
3. David Turner, David Abercrombie, James McNames, W. Robert Daasch, Robert Madge
   Isolating and Removing Sources of Variation in Test Data. [Citation Graph (0, 0)][DBLP]
   ITC, 2002, pp:464-471 [Conf]
   
4. David Abercrombie, Bernd Koenemann, Nagesh Tamarapalli, Srikanth Venkataraman
   DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield. [Citation Graph (0, 0)][DBLP]
   VLSI Design, 2006, pp:14- [Conf]
   
5. Jay Jahangiri, David Abercrombie
   Value-Added Defect Testing Techniques. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 2005, v:22, n:3, pp:224-231 [Journal]
   
6. 
   Use of lithography simulation for the calibration of equation-based design rule checks. [Citation Graph (, )][DBLP]
   
   
7. 
   An innovative method to automate the waiver of IP-level DRC violations. [Citation Graph (, )][DBLP]