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David Abercrombie: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Jay Jahangiri, David Abercrombie
    Meeting Nanometer DPM Requirements Through DFT. [Citation Graph (0, 0)][DBLP]
    ISQED, 2005, pp:276-282 [Conf]
  2. Manu Rehani, David Abercrombie, Robert Madge, Jim Teisher, Jason Saw
    ATE Data Collection - A comprehensive requirements proposal to maximize ROI of test. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:181-189 [Conf]
  3. David Turner, David Abercrombie, James McNames, W. Robert Daasch, Robert Madge
    Isolating and Removing Sources of Variation in Test Data. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:464-471 [Conf]
  4. David Abercrombie, Bernd Koenemann, Nagesh Tamarapalli, Srikanth Venkataraman
    DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 2006, pp:14- [Conf]
  5. Jay Jahangiri, David Abercrombie
    Value-Added Defect Testing Techniques. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:3, pp:224-231 [Journal]

  6. Use of lithography simulation for the calibration of equation-based design rule checks. [Citation Graph (, )][DBLP]


  7. An innovative method to automate the waiver of IP-level DRC violations. [Citation Graph (, )][DBLP]


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