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Young-Kwan Park: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Won-Seok Lee, Keun-Ho Lee, Jin-Kyu Park, Tae-Kyung Kim, Young-Kwan Park, Jeong-Taek Kong
    Investigation of the capacitance deviation due to metal-fills and the effective interconnect geometry modeling. [Citation Graph (0, 0)][DBLP]
    ISQED, 2003, pp:373-376 [Conf]
  2. Young-Gu Kim, Sang-Hoon Lee, Dae-Han Kim, Jae-Woo Im, Sung-Eun Yu, Dae-Wook Kim, Young-Kwan Park, Jeong-Taek Kong
    Sensing Margin Analysis of MLC Flash Memories Using a Novel Unified Statistical Model. [Citation Graph (0, 0)][DBLP]
    ISQED, 2006, pp:185-189 [Conf]
  3. Kwan-Do Kim, Young-Kwan Park, Jun-Ha Lee, Jeong-Taek Kong, Hee-Sung Kang, Young-Wug Kim, Seok-Jin Kim
    Three Dimensional Analysis of Thermal Degradation Effects in FDSOI MOSFET's. [Citation Graph (0, 0)][DBLP]
    ISQED, 2000, pp:87-0 [Conf]
  4. Tae-Jin Kwon, Sang-Hoon Lee, Tae-Seon Kim, Hoe-Jin Lee, Young-Kwan Park, Taek-Soo Kim, Seok-Jin Kim, Jeong-Taek Kong
    Performance Improvement for High Speed Devices Using E-tests and the SPICE Model. [Citation Graph (0, 0)][DBLP]
    ISQED, 2001, pp:443-0 [Conf]
  5. Jin-Kyu Park, Keun-Ho Lee, Chang-Sub Lee, Gi-Young Yang, Young-Kwan Park, Jeong-Taek Kong
    Characterizing the Current Degradation of Abnormally Structured MOS Transistors Using a 3D Poisson Solver. [Citation Graph (0, 0)][DBLP]
    ISQED, 2002, pp:322-325 [Conf]

  6. The Statistical Failure Analysis for the Design of Robust SRAM in Nano-Scale Era. [Citation Graph (, )][DBLP]

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