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Valeriy Sukharev: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Valeriy Sukharev
    Physically-Based Simulation of Electromigration Induced Failures in Copper Dual-Damascene Interconnect. [Citation Graph (0, 0)][DBLP]
    ISQED, 2004, pp:225-231 [Conf]
  2. Valeriy Sukharev
    Physically based simulation of electromigration-induced degradation mechanisms in dual-inlaid copper interconnects. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 2005, v:24, n:9, pp:1326-1335 [Journal]

  3. Closed-form modeling of layout-dependent mechanical stress. [Citation Graph (, )][DBLP]


  4. Control of design specific variation in etch-assisted via pattern transfer by means of full-chip simulation. [Citation Graph (, )][DBLP]


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