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Sai Raghuram Durbha: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Amit Laknaur, Rui Xiao, Sai Raghuram Durbha, Haibo Wang
    Design of a Window Comparator with Adaptive Error Threshold for Online Testing Applications. [Citation Graph (0, 0)][DBLP]
    ISQED, 2007, pp:501-506 [Conf]
  2. Sai Raghuram Durbha, Amit Laknaur, Haibo Wang
    Investigating the Efficiency of Integrator-Based Capacitor Array Testing Techniques. [Citation Graph (0, 0)][DBLP]
    VTS, 2006, pp:320-325 [Conf]
  3. Amit Laknaur, Sai Raghuram Durbha, Haibo Wang
    Built-In-Self-Testing Techniques for Programmable Capacitor Arrays. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2006, v:22, n:4-6, pp:449-462 [Journal]

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