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Alfred L. Crouch: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Alfred L. Crouch, Phil Burlison, Dennis J. Ciplickas
    Processing High Volume Scan Test Results for Yield Learning. [Citation Graph (0, 0)][DBLP]
    ISQED, 2007, pp:293-298 [Conf]
  2. Alfred L. Crouch
    Testing the Tester: What Broke? Where? When? Why? [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:28- [Conf]
  3. Alfred L. Crouch
    Future Trends in Test: The Adoption and Use of Low Cost Structural Testers. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:698-703 [Conf]
  4. Alfred L. Crouch, Michael Mateja, Teresa L. McLaurin, John C. Potter, Dat Tran
    The testability features of the 3rd generation ColdFire family of microprocessors. [Citation Graph (0, 0)][DBLP]
    ITC, 1999, pp:913-922 [Conf]
  5. Alfred L. Crouch, Matthew Pressly, Joe Circello
    Testabilty Features of the MC 68060 Microprocessor. [Citation Graph (0, 0)][DBLP]
    ITC, 1994, pp:60-69 [Conf]
  6. Alfred L. Crouch, Rick Ramus, Colin Maunder
    Low-Power Mode and IEEE 1149.1 Compliance - A Low-Power Solution. [Citation Graph (0, 0)][DBLP]
    ITC, 1994, pp:660-669 [Conf]
  7. Andy Halliday, Greg Young, Alfred L. Crouch
    Prototype Testing Simplified by Scannable Buffers and Latches. [Citation Graph (0, 0)][DBLP]
    ITC, 1989, pp:174-181 [Conf]
  8. Michael Mateja, Alfred L. Crouch, Renny Eisele, Grady Giles, Dale Amason
    A Case Study of the Test Development for the 2nd Generation ColdFire® Microprocessors. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:424-432 [Conf]
  9. Bahram Pouya, Alfred L. Crouch
    Optimization trade-offs for vector volume and test power. [Citation Graph (0, 0)][DBLP]
    ITC, 2000, pp:873-881 [Conf]
  10. Dale Amason, Alfred L. Crouch, Renny Eisele, Grady Giles, Michael Mateja
    Test Development for Second-Generation ColdFire Microprocessors. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1998, v:15, n:3, pp:70-76 [Journal]
  11. Alfred L. Crouch, Michael Mateja, Teresa L. McLaurin, John C. Potter, Dat Tran
    Test Development for a Third-Version ColdFire Microprocessor. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2000, v:17, n:4, pp:29-37 [Journal]
  12. Alfred L. Crouch, John C. Potter, Jason Doege
    AC Scan Path Selection for Physical Debugging. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2003, v:20, n:5, pp:34-40 [Journal]

  13. A Production IR-Drop Screen on a Chip. [Citation Graph (, )][DBLP]


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