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Y. S. Kim :
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Y. S. Kim , J. C. Kim , E. J. Park , Joonwhoan Lee Vision-Based Self-localization of Autonomous Guided Vehicle Using Landmarks of Colored Pentagons. [Citation Graph (0, 0)][DBLP ] ISVC (1), 2006, pp:133-140 [Conf ] K. C. Lee , J. S. Park , Y. S. Kim , Yung-Tai Byun Missing Value Estimation Based on Dynamic Attribute Selection. [Citation Graph (0, 0)][DBLP ] PAKDD, 2000, pp:134-137 [Conf ] Dong Geon Kim , S. Hahn , Y. S. Kim A Syndrome-Distribution Decoding of Mols Lp Codes. [Citation Graph (0, 0)][DBLP ] Ars Comb., 2000, v:56, n:, pp:- [Journal ] Y. S. Kim , E. Wang Recognition of machining features for cast then machined parts. [Citation Graph (0, 0)][DBLP ] Computer-Aided Design, 2002, v:34, n:1, pp:71-87 [Journal ] Y. S. Kim Maximizing sellers' welfare in online auction by simulating bidders' proxy bidding agents. [Citation Graph (0, 0)][DBLP ] Expert Syst. Appl., 2007, v:32, n:2, pp:289-298 [Journal ] J. Y. Seo , K. J. Lee , Y. S. Kim , S. Y. Lee , S. J. Hwang , C. K. Yoon Reliability for Recessed Channel Structure n-MOSFET. [Citation Graph (0, 0)][DBLP ] Microelectronics Reliability, 2005, v:45, n:9-11, pp:1317-1320 [Journal ] T. H. Im , I. K. Eom , Y. S. Kim Wavelet-based moving object segmentation using background registration technique. [Citation Graph (0, 0)][DBLP ] SIP, 2007, pp:82-86 [Conf ] S. H. Hyun , S. S. Kim , I. K. Eom , Y. S. Kim Estimation of edge direction for block error concealment using hypothesis testing problem. [Citation Graph (0, 0)][DBLP ] SIP, 2007, pp:392-397 [Conf ] Search in 0.001secs, Finished in 0.002secs