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Publications of Author

1. Tiago R. Balen, Fernanda Lima Kastensmidt, Marcelo Lubaszewski, Michel Renovell
   Single Event Upset in SRAM-based Field Programmable Analog Arrays: Effects and Mitigation. [Citation Graph (0, 0)][DBLP]
   ISVLSI, 2007, pp:192-197 [Conf]
   
2. Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Michel Renovell, Marcelo Lubaszewski
   Testing the Configurable Analog Blocks of Field Programmable Analog Arrays. [Citation Graph (0, 0)][DBLP]
   ITC, 2004, pp:893-902 [Conf]
   
3. Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Marcelo Lubaszewski, Michel Renovell
   An Approach to the Built-In Self-Test of Field Programmable Analog Arrays. [Citation Graph (0, 0)][DBLP]
   VTS, 2004, pp:383-388 [Conf]
   
4. Tiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell
   Functional Test of Field Programmable Analog Arrays. [Citation Graph (0, 0)][DBLP]
   VTS, 2006, pp:326-333 [Conf]
   
5. Gustavo Pereira, Antonio Andrade Jr., Tiago R. Balen, Marcelo Lubaszewski, Florence Azaïs, Michel Renovell
   Testing the Interconnect Networks and I/O Resources of Field Programmable Analog Arrays. [Citation Graph (0, 0)][DBLP]
   VTS, 2005, pp:389-394 [Conf]
   
6. Antonio Andrade Jr., Gustavo Vieira, Tiago R. Balen, Marcelo Lubaszewski, Florence Azaïs, Michel Renovell
   Built-in self-test of global interconnects of field programmable analog arrays. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2005, v:36, n:12, pp:1112-1123 [Journal]
   
7. Tiago R. Balen, Antonio Q. Andrade, Florence Azaïs, Marcelo Lubaszewski, Michel Renovell
   Applying the Oscillation Test Strategy to FPAA's Configurable Analog Blocks. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2005, v:21, n:2, pp:135-146 [Journal]
   
8. 
   Increasing reliability of programmable mixed-signal systems by applying design diversity redundancy. [Citation Graph (, )][DBLP]