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Shinpei Kamata: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Masaaki Arao, Takao Tadokoro, Hiromi Maruyama, Shinpei Kamata
    Tester Correlation Problem in Memory Testers Used in Production Lines. [Citation Graph (0, 0)][DBLP]
    ITC, 1983, pp:464-470 [Conf]
  2. Junji Nishiura, Toshio Maruyama, Hiromi Maruyama, Shinpei Kamata
    Testing VLSI Microprocessor with New Functional Capability. [Citation Graph (0, 0)][DBLP]
    ITC, 1982, pp:628-633 [Conf]
  3. Shigeru Sugamori, Kunio Takeuchi, Hiromi Maruyama, Shinpei Kamata
    High-Fidelity Device Tester Interface. [Citation Graph (0, 0)][DBLP]
    ITC, 1983, pp:371-378 [Conf]
  4. Shigeru Sugamori, Kenji Yoshida, Hiromi Maruyama, Shinpei Kamata, Tsuneta Sudo
    Analysis and Definition of Overall Timing Accuracy in VLSI Test System. [Citation Graph (0, 0)][DBLP]
    ITC, 1981, pp:143-153 [Conf]

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