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Jerry M. Soden: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. B. Alorda, M. Rosales, Jerry M. Soden, Charles F. Hawkins, Jaume Segura
    Charge Based Transient Current Testing (CBT) for Submicron CMOS SRAMs. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:947-953 [Conf]
  2. Edward I. Cole Jr., Jerry M. Soden, Paiboon Tangyunyong, Patrick L. Candelaria, Richard W. Beegle, Daniel L. Barton, Christopher L. Henderson, Charles F. Hawkins
    Transient Power Supply Voltage (VDDT) Analysis for Detecting IC Defects. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:23-31 [Conf]
  3. Charles F. Hawkins, Jerry M. Soden, Alan W. Righter, F. Joel Ferguson
    Defect Classes - An Overdue Paradigm for CMOS IC. [Citation Graph (0, 0)][DBLP]
    ITC, 1994, pp:413-425 [Conf]
  4. Christopher L. Henderson, Jerry M. Soden
    Signature Analysis for IC Diagnosis and Failure Analysis. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:310-318 [Conf]
  5. Christopher L. Henderson, Jerry M. Soden, Charles F. Hawkins
    The Behavior and Testing Implications of CMOS IC Logic Gate Open Circuits. [Citation Graph (0, 0)][DBLP]
    ITC, 1991, pp:302-310 [Conf]
  6. Alan W. Righter, Charles F. Hawkins, Jerry M. Soden, Peter C. Maxwell
    CMOS IC reliability indicators and burn-in economics. [Citation Graph (0, 0)][DBLP]
    ITC, 1998, pp:194-203 [Conf]
  7. Alan W. Righter, Jerry M. Soden, Richard W. Beegle
    High Resolution IDDQ Characterization and Testing - Practical Issues. [Citation Graph (0, 0)][DBLP]
    ITC, 1996, pp:259-268 [Conf]
  8. Jaume Segura, Ali Keshavarzi, Jerry M. Soden, Charles F. Hawkins
    Parametric Failures in CMOS ICs - A Defect-Based Analysis. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:90-99 [Conf]
  9. Jerry M. Soden, Richard E. Anderson, Christopher L. Henderson
    IC Failure Analysis Tools and Techniques - Macig, Mystery, and Science. [Citation Graph (0, 0)][DBLP]
    ITC, 1996, pp:935- [Conf]
  10. Jerry M. Soden, Charles F. Hawkins
    Electrical Characteristics and Testing Considerations for Gate Oxide Shorts in CMOS ICs. [Citation Graph (0, 0)][DBLP]
    ITC, 1985, pp:544-557 [Conf]
  11. Jerry M. Soden, Charles F. Hawkins
    Reliability and Electrical Properties of Gate Oxide Shorts in CMOS ICs. [Citation Graph (0, 0)][DBLP]
    ITC, 1986, pp:443-451 [Conf]
  12. Jerry M. Soden, Charles F. Hawkins
    Quality Testing Requires Quality Thinking. [Citation Graph (0, 0)][DBLP]
    ITC, 1993, pp:596- [Conf]
  13. Jerry M. Soden, Christopher L. Henderson
    IC Diagnosis: Industry Issues. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:435- [Conf]
  14. Jerry M. Soden, R. Keith Treece, Michael R. Taylor, Charles F. Hawkins
    CMOS IC Stuck-Open Fault Electrical Effects and Design Considerations. [Citation Graph (0, 0)][DBLP]
    ITC, 1989, pp:423-430 [Conf]
  15. I. de Paúl, M. Rosales, B. Alorda, Jaume Segura, Charles F. Hawkins, Jerry M. Soden
    Defect Oriented Fault Diagnosis for Semiconductor Memories using Charge Analysis: Theory and Experiments. [Citation Graph (0, 0)][DBLP]
    VTS, 2001, pp:286-291 [Conf]
  16. Charles F. Hawkins, Jerry M. Soden
    IDDQ Design and Test Advantages Propel Industry. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1995, v:12, n:2, pp:40-41 [Journal]
  17. Charles F. Hawkins, Jerry M. Soden
    Deep Submicron CMOS Current IC Testing: Is There a Future? [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1999, v:16, n:4, pp:14-15 [Journal]
  18. Charles F. Hawkins, Jaume Segura, Jerry M. Soden, Ted Dellin
    Test and Reliability: Partners in IC Manufacturing, Part 2. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1999, v:16, n:4, pp:66-73 [Journal]
  19. Jerry M. Soden, Richard E. Anderson, Christopher L. Henderson
    IC Failure Analysis: Magic, Mystery, and Science. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1997, v:14, n:3, pp:59-69 [Journal]
  20. Jerry M. Soden, Charles F. Hawkins
    IDDQ Testing: Issues Present and Future. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1996, v:13, n:4, pp:61-65 [Journal]
  21. Jerry M. Soden, Christopher L. Henderson
    Still in the Stone Age? [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1997, v:14, n:3, pp:128-0 [Journal]

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