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Hari Balachandran: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Hari Balachandran, Kenneth M. Butler, Neil Simpson
    Facilitating Rapid First Silicon Debug. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:628-637 [Conf]
  2. Hari Balachandran, Jason Parker, Gordon Gammie, John W. Olson, Craig Force, Kenneth M. Butler, Sri Jandhyala
    Expediting ramp-to-volume production. [Citation Graph (0, 0)][DBLP]
    ITC, 1999, pp:103-112 [Conf]
  3. Hari Balachandran, Jason Parker, Daniel Shupp, Stephanie Butler, Kenneth M. Butler, Craig Force, Jason Smith
    Correlation of logical failures to a suspect process step. [Citation Graph (0, 0)][DBLP]
    ITC, 1999, pp:458-476 [Conf]
  4. Sri Jandhyala, Hari Balachandran, Anura P. Jayasumana
    Clustering based techniques for I_DDQ testing. [Citation Graph (0, 0)][DBLP]
    ITC, 1999, pp:730-737 [Conf]
  5. Anjali Kinra, Hari Balachandran, Regy Thomas, John Carulli
    Logic mapping on a microprocessor. [Citation Graph (0, 0)][DBLP]
    ITC, 2000, pp:701-710 [Conf]
  6. Wangqi Qiu, Jing Wang, D. M. H. Walker, Divya Reddy, Zhuo Li, Weiping Shi, Hari Balachandran
    K Longest Paths Per Gate (KLPG) Test Generation for Scan-Based Sequential Circuits. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:223-231 [Conf]
  7. Jayashree Saxena, Kenneth M. Butler, Hari Balachandran, David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess
    On applying non-classical defect models to automated diagnosis. [Citation Graph (0, 0)][DBLP]
    ITC, 1998, pp:748-757 [Conf]
  8. Zoran Stanojevic, Hari Balachandran, D. M. H. Walker, Fred Lakbani, Jayashree Saxena, Kenneth M. Butler
    Computer-aided fault to defect mapping (CAFDM) for defect diagnosis. [Citation Graph (0, 0)][DBLP]
    ITC, 2000, pp:729-738 [Conf]
  9. Hari Balachandran, D. M. H. Walker
    Improvement of SRAM-based failure analysis using calibrated Iddq testing. [Citation Graph (0, 0)][DBLP]
    VTS, 1996, pp:130-137 [Conf]
  10. Michael R. Grimaila, Sooryong Lee, Jennifer Dworak, Kenneth M. Butler, Bret Stewart, Hari Balachandran, Bryan Houchins, Vineet Mathur, Jaehong Park, Li-C. Wang, M. Ray Mercer
    REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen. [Citation Graph (0, 0)][DBLP]
    VTS, 1999, pp:268-274 [Conf]
  11. Sri Jandhyala, Hari Balachandran, Manidip Sengupta, Anura P. Jayasumana
    Clustering Based Evaluation of IDDQ Measurements: Applications in Testing and Classification of ICs. [Citation Graph (0, 0)][DBLP]
    VTS, 2000, pp:444-452 [Conf]

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