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Paul H. Bardell: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Paul H. Bardell
    Calculating the Effects of Linear Dependencies in m-Sequences Used as Test Stimuli. [Citation Graph (0, 0)][DBLP]
    ITC, 1989, pp:252-256 [Conf]
  2. Paul H. Bardell, Michael J. Lapointe
    Production Experience with Built-In Self-Test in the IBM ES/9000 System. [Citation Graph (0, 0)][DBLP]
    ITC, 1991, pp:28-36 [Conf]
  3. Paul H. Bardell, William H. McAnney
    Self-Testing of Multichip Logic Modules. [Citation Graph (0, 0)][DBLP]
    ITC, 1982, pp:200-204 [Conf]
  4. Paul H. Bardell, William H. McAnney
    Parallel Pseudorandom Sequences for Built-In Test. [Citation Graph (0, 0)][DBLP]
    ITC, 1984, pp:302-308 [Conf]
  5. Paul H. Bardell, William H. McAnney
    Self-Test of Random Access Memories. [Citation Graph (0, 0)][DBLP]
    ITC, 1985, pp:352-355 [Conf]
  6. William H. McAnney, Paul H. Bardell, V. P. Gupta
    Random Testing for Stuck-At Storage Cells in an Embedded Memory. [Citation Graph (0, 0)][DBLP]
    ITC, 1984, pp:157-166 [Conf]
  7. Jacob Savir, Paul H. Bardell
    On Random Pattern Test Length. [Citation Graph (0, 0)][DBLP]
    ITC, 1983, pp:95-107 [Conf]
  8. Paul H. Bardell, William H. McAnney
    Pseudorandom Arrays for Built-In Tests. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1986, v:35, n:7, pp:653-658 [Journal]
  9. Jacob Savir, Gary S. Ditlow, Paul H. Bardell
    Random Pattern Testability. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1984, v:33, n:1, pp:79-90 [Journal]
  10. Jacob Savir, Paul H. Bardell
    On Random Pattern Test Length. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1984, v:33, n:6, pp:467-474 [Journal]
  11. Paul H. Bardell
    Calculating the effects of linear dependencies in m-sequences used as test stimuli. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1992, v:11, n:1, pp:83-86 [Journal]
  12. Jacob Savir, Paul H. Bardell
    Partitioning of polynomial tasks: test generation, an example. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1991, v:10, n:11, pp:1465-1468 [Journal]

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