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E. Kofi Vida-Torku:
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Publications of Author
- C. C. Beh, K. H. Arya, Charles E. Radke, E. Kofi Vida-Torku
Do Stuck Fault Models Reflect Manufacturing Defects? [Citation Graph (0, 0)][DBLP] ITC, 1982, pp:35-42 [Conf]
- Craig Hunter, E. Kofi Vida-Torku, Johnny LeBlanc
Balancing Structured and Ad-hoc Design for Test: Testing of the PowerPC 603TM Microprocessor. [Citation Graph (0, 0)][DBLP] ITC, 1994, pp:76-83 [Conf]
- E. Kofi Vida-Torku
Impact of Boundary Scan Design on Delay Test. [Citation Graph (0, 0)][DBLP] ITC, 1992, pp:96-105 [Conf]
- E. Kofi Vida-Torku, George Joos
Designing for scan test of high performance embedded memories. [Citation Graph (0, 0)][DBLP] ITC, 1998, pp:101-0 [Conf]
- E. Kofi Vida-Torku, James A. Monzel, Charles E. Radke
Performance Assurance of Memories Embedded in VLSI Chips. [Citation Graph (0, 0)][DBLP] ITC, 1986, pp:154-160 [Conf]
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