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Publications of Author

1. Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski
   Impact of Multiple-Detect Test Patterns on Product Quality. [Citation Graph (0, 0)][DBLP]
   ITC, 2003, pp:1031-1040 [Conf]
   
2. Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler
   In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. [Citation Graph (0, 0)][DBLP]
   ITC, 2004, pp:203-212 [Conf]
   
3. Robert Madge, B. H. Goh, V. Rajagopalan, C. Macchietto, W. Robert Daasch, Chris Schuermyer, C. Taylor, David Turner
   Screening MinVDD Outliers Using Feed-Forward Voltage Testing. [Citation Graph (0, 0)][DBLP]
   ITC, 2002, pp:673-682 [Conf]
   
4. Chris Schuermyer, Brady Benware, Kevin Cota, Robert Madge, W. Robert Daasch, L. Ning
   Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ. [Citation Graph (0, 0)][DBLP]
   ITC, 2003, pp:565-573 [Conf]
   
5. Chris Schuermyer, Jens Ruffler, W. Robert Daasch
   Minimum Testing Requirements to Screen Temperature Dependent Defects. [Citation Graph (0, 0)][DBLP]
   ITC, 2004, pp:300-308 [Conf]
   
6. Chris Schuermyer, Jewel Pangilinan, Jay Jahangiri, Martin Keim, Janusz Rajski, Brady Benware
   Silicon Evaluation of Static Alternative Fault Models. [Citation Graph (0, 0)][DBLP]
   VTS, 2007, pp:265-270 [Conf]
   
7. Jeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R. D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer
   Extracting Defect Density and Size Distributions from Product ICs. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 2006, v:23, n:5, pp:390-400 [Journal]