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Sreenevasan Ranganathan: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski
    Impact of Multiple-Detect Test Patterns on Product Quality. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:1031-1040 [Conf]

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