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Alan W. Righter: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. J. S. Beasley, S. Pour-Mozafari, D. Huggett, Alan W. Righter, C. J. Apodaca
    iDD Pulse Response Testing Applied to Complex CMOS ICs. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:32-39 [Conf]
  2. Charles F. Hawkins, Jerry M. Soden, Alan W. Righter, F. Joel Ferguson
    Defect Classes - An Overdue Paradigm for CMOS IC. [Citation Graph (0, 0)][DBLP]
    ITC, 1994, pp:413-425 [Conf]
  3. Alan W. Righter
    Solving Known Good Die (and Substrate) Test Issues. [Citation Graph (0, 0)][DBLP]
    ITC, 1995, pp:916- [Conf]
  4. Alan W. Righter, Charles F. Hawkins, Jerry M. Soden, Peter C. Maxwell
    CMOS IC reliability indicators and burn-in economics. [Citation Graph (0, 0)][DBLP]
    ITC, 1998, pp:194-203 [Conf]
  5. Alan W. Righter, Jerry M. Soden, Richard W. Beegle
    High Resolution IDDQ Characterization and Testing - Practical Issues. [Citation Graph (0, 0)][DBLP]
    ITC, 1996, pp:259-268 [Conf]
  6. Kenneth M. Wallquist, Alan W. Righter, Charles F. Hawkins
    A General Purpose IDDQ Measurement Circuit. [Citation Graph (0, 0)][DBLP]
    ITC, 1993, pp:642-651 [Conf]

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