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Frans de Jong: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]
Publications of Author
- Alex Biewenga, Henk D. L. Hollmann, Frans de Jong, Maurice Lousberg
Static component interconnect test technology (SCITT) a new technology for assembly testing. [Citation Graph (0, 0)][DBLP]
ITC, 1999, pp:439-448 [Conf] - Frans de Jong
SCITT: Back to Basics in Mass Production Testing. [Citation Graph (0, 0)][DBLP]
ITC, 1999, pp:1138- [Conf] - Frans de Jong, Frank van der Heyden
Testing the Integrity of the Boundary Scan Test Infrastructure. [Citation Graph (0, 0)][DBLP]
ITC, 1991, pp:106-112 [Conf] - Frans de Jong, Ben Kup, Rodger Schuttert
Power pin testing: making the test coverage complete. [Citation Graph (0, 0)][DBLP]
ITC, 2000, pp:575-584 [Conf] - Frans de Jong, Leon van de Logt
IEEE P1581: To Live or Let die? [Citation Graph (0, 0)][DBLP]
ITC, 2003, pp:1278- [Conf] - Frans de Jong, Rob Raaijmakers
Static component interconnection test technology in practice. [Citation Graph (0, 0)][DBLP]
ITC, 1999, pp:556-565 [Conf] - Frans de Jong, Adriaan J. de Lind van Wijngaarden
Memory Interconnection Test at Board Level. [Citation Graph (0, 0)][DBLP]
ITC, 1992, pp:328-337 [Conf] - Wouter Rijckaert, Frans de Jong
Board Test Coverage: The Value of Prediction and How to Compare Numbers. [Citation Graph (0, 0)][DBLP]
ITC, 2003, pp:1277- [Conf] - Rodger Schuttert, Frans de Jong, Ben Kup
Improved Test Monitor Circuit in Power Pin DfT. [Citation Graph (0, 0)][DBLP]
VTS, 2002, pp:345-350 [Conf]
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