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Eric Bruls: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Eric Bruls
    Variable Supply Voltage Testing for Analogue CMOS and Bipolar Circuits. [Citation Graph (0, 0)][DBLP]
    ITC, 1994, pp:562-571 [Conf]
  2. Eric Bruls, F. Camerik, H. J. Kretschman, Jochen A. G. Jess
    A Generic Method to Develop a Defect Monitoring System for IC Processes. [Citation Graph (0, 0)][DBLP]
    ITC, 1991, pp:218-227 [Conf]
  3. R. J. A. Harvey, Andrew M. D. Richardson, Eric Bruls, Keith Baker
    Analogue Fault Simulation Based on Layout-Dependent Fault Models. [Citation Graph (0, 0)][DBLP]
    ITC, 1994, pp:641-649 [Conf]
  4. Rosa Rodríguez-Montañés, Joan Figueras, Eric Bruls
    Bridging Defects Resistance Measurements in a CMOS Process. [Citation Graph (0, 0)][DBLP]
    ITC, 1992, pp:892-899 [Conf]
  5. Marly Roncken, Eric Bruls
    Test Quality of Asynchronous Circuits: A Defect-oriented Evaluation. [Citation Graph (0, 0)][DBLP]
    ITC, 1996, pp:205-214 [Conf]
  6. M. M. A. van Rosmalen, Keith Baker, Eric Bruls, Jochen A. G. Jess
    Parameter Monitoring: Advantages and Pitfalls. [Citation Graph (0, 0)][DBLP]
    ITC, 1993, pp:115-124 [Conf]

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