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Kyung Tek Lee: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Kyung Tek Lee, Jacob A. Abraham
    Critical path identification and delay tests of dynamic circuits. [Citation Graph (0, 0)][DBLP]
    ITC, 1999, pp:421-430 [Conf]
  2. Kyung Tek Lee, Clay Nordquist, Jacob A. Abraham
    Automatic Test Pattern Generation for Crosstalk Glitches in Digital Circuits. [Citation Graph (0, 0)][DBLP]
    VTS, 1998, pp:34-41 [Conf]
  3. Rathish Jayabharathi, Kyung Tek Lee, Jacob A. Abraham
    A Novel Solution for Chip-Level Functional Timing Verification. [Citation Graph (0, 0)][DBLP]
    VTS, 1997, pp:137-142 [Conf]

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