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Bill Bottoms :
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Bill Bottoms Homegrown Tools and Equipment versus EDA and ATE Vendors: The Future of Design to Test Product Lines. [Citation Graph (0, 0)][DBLP ] ITC, 2002, pp:24- [Conf ] Bill Bottoms , Jim Chung , Bernd Koenemann , Glenn Shirley , Lisa Spainhower Guaranteeing Quality throughout the Product Life Cycle: On-Line Test and Repair to the Rescue. [Citation Graph (0, 0)][DBLP ] VTS, 2001, pp:153-154 [Conf ] Bill Bottoms , Lee Song , Paul Patton , Wilhelm Radermacher A Successful DFT Tester: What Will It Look Like? Is DFT Tester a Logical Next Step in ATE Evolution? [Citation Graph (0, 0)][DBLP ] VTS, 2002, pp:129-132 [Conf ] Bill Bottoms The Third Millennium's Test Dilemma. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1998, v:15, n:4, pp:7-11 [Journal ] Search in 0.001secs, Finished in 0.001secs