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Frank Bouwman: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Frank Bouwman, Steven Oostdijk, Rudi Stans, Ben Bennetts, Frans P. M. Beenker
    Macro Testability: The Results of Production Device Applications. [Citation Graph (0, 0)][DBLP]
    ITC, 1992, pp:232-241 [Conf]
  2. Frank Bouwman, Taco Zwemstra, Sonny Hartanto, Keith Baker, Jan Koopmans
    Application of Joint Time-Frequency Analysis in Mixed-Signal Testing. [Citation Graph (0, 0)][DBLP]
    ITC, 1994, pp:747-756 [Conf]
  3. Hans Bouwmeester, Steven Oostdijk, Frank Bouwman, Rudi Stans, Loek Thijssen, Frans P. M. Beenker
    Minimizing Test Time by Exploiting Parallelism in Macro Test. [Citation Graph (0, 0)][DBLP]
    ITC, 1993, pp:451-460 [Conf]
  4. Bart Vermeulen, Steven Oostdijk, Frank Bouwman
    Test and debug strategy of the PNX8525 NexperiaTM digital video platform system chip. [Citation Graph (0, 0)][DBLP]
    ITC, 2001, pp:121-130 [Conf]

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