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Eugene R. Hnatek: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]
Publications of Author
- Rick Boyle, Jack Donovan, Eugene R. Hnatek, Alex M. Ijaz
Application of Statistical Techniques to Critical System Parameters. [Citation Graph (0, 0)][DBLP]
ITC, 1993, pp:108-114 [Conf] - Eugene R. Hnatek
Documentation for Testability : The Supplier's Responsibility to the User. [Citation Graph (0, 0)][DBLP]
ITC, 1981, pp:370-372 [Conf] - Eugene R. Hnatek
Thoughts on VLSI Burn-in. [Citation Graph (0, 0)][DBLP]
ITC, 1984, pp:531-535 [Conf] - Eugene R. Hnatek
IC Burn-In : The Changing Scene. [Citation Graph (0, 0)][DBLP]
ITC, 1986, pp:228-231 [Conf] - Eugene R. Hnatek, Billy R. Livesay
Quality Issues of High Pin Count Fine Pitch VLSI Packages. [Citation Graph (0, 0)][DBLP]
ITC, 1989, pp:397-422 [Conf] - Eugene R. Hnatek, Beau R. Wilson Jr.
An Evaluation of the 2816 EEPROM. [Citation Graph (0, 0)][DBLP]
ITC, 1982, pp:225-235 [Conf] - Alex M. Ijaz, Eugene R. Hnatek
User Application of Statistical Process Monitor Techniques to ASIC Critical Parameters. [Citation Graph (0, 0)][DBLP]
ITC, 1995, pp:233-241 [Conf] - Beau R. Wilson Jr., Eugene R. Hnatek
Problems Encountered in Developing VLSI Test Programs for COT (A Practical Outlook). [Citation Graph (0, 0)][DBLP]
ITC, 1984, pp:778-788 [Conf] - Donald Staab, Eugene R. Hnatek
Diagnosing IC Failures in a Fast Environment. [Citation Graph (0, 0)][DBLP]
IEEE Design & Test of Computers, 1997, v:14, n:3, pp:70-75 [Journal]
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