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Publications of Author

1. Jonathan T.-Y. Chang, Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey
   Analysis of pattern-dependent and timing-dependent failures in an experimental test chip. [Citation Graph (0, 0)][DBLP]
   ITC, 1998, pp:184-193 [Conf]
   
2. Chien-Mo James Li, Edward J. McCluskey
   Testing for tunneling opens. [Citation Graph (0, 0)][DBLP]
   ITC, 2000, pp:85-94 [Conf]
   
3. Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey
   Testing for resistive opens and stuck opens. [Citation Graph (0, 0)][DBLP]
   ITC, 2001, pp:1049-1058 [Conf]
   
4. Chien-Mo James Li, Edward J. McCluskey
   Diagnosis of Tunneling Opens. [Citation Graph (0, 0)][DBLP]
   VTS, 2001, pp:22-27 [Conf]
   
5. Chien-Mo James Li, Edward J. McCluskey
   Diagnosis of Sequence-Dependent Chips. [Citation Graph (0, 0)][DBLP]
   VTS, 2002, pp:187-192 [Conf]
   
6. Min-Hao Chiu, Chien-Mo James Li
   Jump Scan: A DFT Technique for Low Power Testing. [Citation Graph (0, 0)][DBLP]
   VTS, 2005, pp:277-282 [Conf]
   
7. Edward J. McCluskey, Ahmad A. Al-Yamani, Chien-Mo James Li, Chao-Wen Tseng, Erik H. Volkerink, Francois-Fabien Ferhani, Edward Li, Subhasish Mitra
   ELF-Murphy Data on Defects and Test Sets. [Citation Graph (0, 0)][DBLP]
   VTS, 2004, pp:16-22 [Conf]
   
8. Chien-Mo James Li, Edward J. McCluskey
   Diagnosis of resistive-open and stuck-open defects in digital CMOS ICs. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. on CAD of Integrated Circuits and Systems, 2005, v:24, n:11, pp:1748-1759 [Journal]
   
9. 
   Fault modeling and testing of retention flip-flops in low power designs. [Citation Graph (, )][DBLP]