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Christopher L. Henderson:
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Publications of Author
- Edward I. Cole Jr., Jerry M. Soden, Paiboon Tangyunyong, Patrick L. Candelaria, Richard W. Beegle, Daniel L. Barton, Christopher L. Henderson, Charles F. Hawkins
Transient Power Supply Voltage (VDDT) Analysis for Detecting IC Defects. [Citation Graph (0, 0)][DBLP] ITC, 1997, pp:23-31 [Conf]
- Christopher L. Henderson, Jerry M. Soden
Signature Analysis for IC Diagnosis and Failure Analysis. [Citation Graph (0, 0)][DBLP] ITC, 1997, pp:310-318 [Conf]
- Christopher L. Henderson, Jerry M. Soden, Charles F. Hawkins
The Behavior and Testing Implications of CMOS IC Logic Gate Open Circuits. [Citation Graph (0, 0)][DBLP] ITC, 1991, pp:302-310 [Conf]
- Christopher L. Henderson, Richard H. Williams, Charles F. Hawkins
Economic Impact of Type I Test Errors at System and Board Levels. [Citation Graph (0, 0)][DBLP] ITC, 1992, pp:444-452 [Conf]
- Jerry M. Soden, Richard E. Anderson, Christopher L. Henderson
IC Failure Analysis Tools and Techniques - Macig, Mystery, and Science. [Citation Graph (0, 0)][DBLP] ITC, 1996, pp:935- [Conf]
- Jerry M. Soden, Christopher L. Henderson
IC Diagnosis: Industry Issues. [Citation Graph (0, 0)][DBLP] ITC, 1997, pp:435- [Conf]
- Jerry M. Soden, Richard E. Anderson, Christopher L. Henderson
IC Failure Analysis: Magic, Mystery, and Science. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 1997, v:14, n:3, pp:59-69 [Journal]
- Jerry M. Soden, Christopher L. Henderson
Still in the Stone Age? [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 1997, v:14, n:3, pp:128-0 [Journal]
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