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Christopher L. Henderson: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Edward I. Cole Jr., Jerry M. Soden, Paiboon Tangyunyong, Patrick L. Candelaria, Richard W. Beegle, Daniel L. Barton, Christopher L. Henderson, Charles F. Hawkins
    Transient Power Supply Voltage (VDDT) Analysis for Detecting IC Defects. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:23-31 [Conf]
  2. Christopher L. Henderson, Jerry M. Soden
    Signature Analysis for IC Diagnosis and Failure Analysis. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:310-318 [Conf]
  3. Christopher L. Henderson, Jerry M. Soden, Charles F. Hawkins
    The Behavior and Testing Implications of CMOS IC Logic Gate Open Circuits. [Citation Graph (0, 0)][DBLP]
    ITC, 1991, pp:302-310 [Conf]
  4. Christopher L. Henderson, Richard H. Williams, Charles F. Hawkins
    Economic Impact of Type I Test Errors at System and Board Levels. [Citation Graph (0, 0)][DBLP]
    ITC, 1992, pp:444-452 [Conf]
  5. Jerry M. Soden, Richard E. Anderson, Christopher L. Henderson
    IC Failure Analysis Tools and Techniques - Macig, Mystery, and Science. [Citation Graph (0, 0)][DBLP]
    ITC, 1996, pp:935- [Conf]
  6. Jerry M. Soden, Christopher L. Henderson
    IC Diagnosis: Industry Issues. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:435- [Conf]
  7. Jerry M. Soden, Richard E. Anderson, Christopher L. Henderson
    IC Failure Analysis: Magic, Mystery, and Science. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1997, v:14, n:3, pp:59-69 [Journal]
  8. Jerry M. Soden, Christopher L. Henderson
    Still in the Stone Age? [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1997, v:14, n:3, pp:128-0 [Journal]

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