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Lee Whetsel: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Francisco DaSilva, Yervant Zorian, Lee Whetsel, Karim Arabi, Rohit Kapur
    Overview of the IEEE P1500 Standard. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:988-997 [Conf]
  2. Rakesh N. Joshi, Kenneth L. Williams, Lee Whetsel
    Evolution of IEEE 1149.1 Addressable Shadow Protocol Devices. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:981-987 [Conf]
  3. Jayashree Saxena, Kenneth M. Butler, Lee Whetsel
    An analysis of power reduction techniques in scan testing. [Citation Graph (0, 0)][DBLP]
    ITC, 2001, pp:670-677 [Conf]
  4. Lee Whetsel
    Adapting scan architectures for low power operation. [Citation Graph (0, 0)][DBLP]
    ITC, 2000, pp:863-872 [Conf]
  5. Lee Whetsel
    Inevitable Use of TAP Domains in SOCs. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:1191- [Conf]
  6. Lee Whetsel
    Adapting JTAG for AC Interconnect Testing. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:641-650 [Conf]
  7. Lee Whetsel
    An IEEE 1149.1 Based Logic/Signature Analyzer in a Chip. [Citation Graph (0, 0)][DBLP]
    ITC, 1991, pp:869-878 [Conf]
  8. Lee Whetsel
    A Proposed Method of Accessing 1149.1 in a Backplane Environment. [Citation Graph (0, 0)][DBLP]
    ITC, 1992, pp:206-216 [Conf]
  9. Lee Whetsel
    Hierarchically Accessing 1149.1 Applications in a System Environment. [Citation Graph (0, 0)][DBLP]
    ITC, 1993, pp:517-526 [Conf]
  10. Lee Whetsel
    An Approach to Accelerate Scan Testing in IEEE 1149.1 Architectures. [Citation Graph (0, 0)][DBLP]
    ITC, 1994, pp:314-322 [Conf]
  11. Lee Whetsel
    Navigating Test Access in Systems. [Citation Graph (0, 0)][DBLP]
    ITC, 1994, pp:1018- [Conf]
  12. Lee Whetsel
    Improved Boundary Scan Design. [Citation Graph (0, 0)][DBLP]
    ITC, 1995, pp:851-860 [Conf]
  13. Lee Whetsel
    Proposal to Simplify Development of a Mixed-Signal Test Standard. [Citation Graph (0, 0)][DBLP]
    ITC, 1996, pp:400-409 [Conf]
  14. Lee Whetsel
    An IEEE 1149.1-Based Test Access Architecture for ICs with Embedded Cores. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:69-78 [Conf]
  15. Lee Whetsel
    Test Access of TAP'ed & Non-TAP'ed Cores. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:1041- [Conf]
  16. Lee Whetsel
    Core test connectivity, communication, and control. [Citation Graph (0, 0)][DBLP]
    ITC, 1998, pp:303-312 [Conf]
  17. Lee Whetsel
    Addressable test ports an approach to testing embedded cores. [Citation Graph (0, 0)][DBLP]
    ITC, 1999, pp:1055-1064 [Conf]
  18. Yervant Zorian, Erik Jan Marinissen, Rohit Kapur, Tony Taylor, Lee Whetsel
    Towards a standard for embedded core test: an example. [Citation Graph (0, 0)][DBLP]
    ITC, 1999, pp:616-627 [Conf]
  19. Lee Whetsel
    A silicon El Niño? [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1997, v:14, n:4, pp:112-0 [Journal]

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