The SCEAS System
Navigation Menu

Search the dblp DataBase

Title:
Author:

Lee Whetsel: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Francisco DaSilva, Yervant Zorian, Lee Whetsel, Karim Arabi, Rohit Kapur
    Overview of the IEEE P1500 Standard. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:988-997 [Conf]
  2. Rakesh N. Joshi, Kenneth L. Williams, Lee Whetsel
    Evolution of IEEE 1149.1 Addressable Shadow Protocol Devices. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:981-987 [Conf]
  3. Jayashree Saxena, Kenneth M. Butler, Lee Whetsel
    An analysis of power reduction techniques in scan testing. [Citation Graph (0, 0)][DBLP]
    ITC, 2001, pp:670-677 [Conf]
  4. Lee Whetsel
    Adapting scan architectures for low power operation. [Citation Graph (0, 0)][DBLP]
    ITC, 2000, pp:863-872 [Conf]
  5. Lee Whetsel
    Inevitable Use of TAP Domains in SOCs. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:1191- [Conf]
  6. Lee Whetsel
    Adapting JTAG for AC Interconnect Testing. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:641-650 [Conf]
  7. Lee Whetsel
    An IEEE 1149.1 Based Logic/Signature Analyzer in a Chip. [Citation Graph (0, 0)][DBLP]
    ITC, 1991, pp:869-878 [Conf]
  8. Lee Whetsel
    A Proposed Method of Accessing 1149.1 in a Backplane Environment. [Citation Graph (0, 0)][DBLP]
    ITC, 1992, pp:206-216 [Conf]
  9. Lee Whetsel
    Hierarchically Accessing 1149.1 Applications in a System Environment. [Citation Graph (0, 0)][DBLP]
    ITC, 1993, pp:517-526 [Conf]
  10. Lee Whetsel
    An Approach to Accelerate Scan Testing in IEEE 1149.1 Architectures. [Citation Graph (0, 0)][DBLP]
    ITC, 1994, pp:314-322 [Conf]
  11. Lee Whetsel
    Navigating Test Access in Systems. [Citation Graph (0, 0)][DBLP]
    ITC, 1994, pp:1018- [Conf]
  12. Lee Whetsel
    Improved Boundary Scan Design. [Citation Graph (0, 0)][DBLP]
    ITC, 1995, pp:851-860 [Conf]
  13. Lee Whetsel
    Proposal to Simplify Development of a Mixed-Signal Test Standard. [Citation Graph (0, 0)][DBLP]
    ITC, 1996, pp:400-409 [Conf]
  14. Lee Whetsel
    An IEEE 1149.1-Based Test Access Architecture for ICs with Embedded Cores. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:69-78 [Conf]
  15. Lee Whetsel
    Test Access of TAP'ed & Non-TAP'ed Cores. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:1041- [Conf]
  16. Lee Whetsel
    Core test connectivity, communication, and control. [Citation Graph (0, 0)][DBLP]
    ITC, 1998, pp:303-312 [Conf]
  17. Lee Whetsel
    Addressable test ports an approach to testing embedded cores. [Citation Graph (0, 0)][DBLP]
    ITC, 1999, pp:1055-1064 [Conf]
  18. Yervant Zorian, Erik Jan Marinissen, Rohit Kapur, Tony Taylor, Lee Whetsel
    Towards a standard for embedded core test: an example. [Citation Graph (0, 0)][DBLP]
    ITC, 1999, pp:616-627 [Conf]
  19. Lee Whetsel
    A silicon El Niño? [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1997, v:14, n:4, pp:112-0 [Journal]

Search in 0.004secs, Finished in 0.005secs
NOTICE1
System may not be available sometimes or not working properly, since it is still in development with continuous upgrades
NOTICE2
The rankings that are presented on this page should NOT be considered as formal since the citation info is incomplete in DBLP
 
System created by asidirop@csd.auth.gr [http://users.auth.gr/~asidirop/] © 2002
for Data Engineering Laboratory, Department of Informatics, Aristotle University © 2002