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Romain Desplats: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]
Publications of Author
- Romain Desplats, Felix Beaudoin, Philippe Perdu, Nagamani Nataraj, Ted Lundquist, Ketan Shah
Fault Localization using Time Resolved Photon Emission and STIL Waveforms. [Citation Graph (0, 0)][DBLP]
ITC, 2003, pp:254-263 [Conf] - Romain Desplats, Felix Beaudoin, Philippe Perdu, P. Poirier, D. Trémouilles, M. Bafleur, D. Lewis
Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2001, v:41, n:9-10, pp:1539-1544 [Journal] - Romain Desplats, Philippe Perdu, Felix Beaudoin
A New Versatile Testing Interface for Failure Analysis in Integrated Circuits. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2001, v:41, n:9-10, pp:1495-1499 [Journal] - Felix Beaudoin, X. Chauffleur, J. P. Fradin, Philippe Perdu, Romain Desplats, D. Lewis
Modeling Thermal Laser Stimulation. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2001, v:41, n:9-10, pp:1477-1482 [Journal] - Felix Beaudoin, Philippe Perdu, Romain Desplats, S. Rigo, D. Lewis
Silicon Thinning and Polishing on Packaged Devices. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2001, v:41, n:9-10, pp:1557-1561 [Journal] - Felix Beaudoin, D. Carisetti, Romain Desplats, Philippe Perdu, D. Lewis, J. C. Clement
Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2002, v:42, n:9-11, pp:1581-1585 [Journal] - O. Crépel, Felix Beaudoin, L. Dantas de Morais, G. Haller, C. Goupil, Philippe Perdu, Romain Desplats, D. Lewis
Backside Hot Spot Detection Using Liquid Crystal Microscopy. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2002, v:42, n:9-11, pp:1741-1746 [Journal] - Felix Beaudoin, G. Haller, Philippe Perdu, Romain Desplats, T. Beauchêne, D. Lewis
Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2002, v:42, n:9-11, pp:1729-1734 [Journal] - Felix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, G. Haller, V. Pouget, D. Lewis
From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2003, v:43, n:9-11, pp:1681-1686 [Journal] - O. Crépel, Romain Desplats, Y. Bouttement, Philippe Perdu, C. Goupil, Ph. Descamps, Felix Beaudoin, L. Marina
Magnetic emission mapping for passive integrated components characterisation. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2003, v:43, n:9-11, pp:1809-1814 [Journal] - M. Remmach, Romain Desplats, Felix Beaudoin, E. Frances, Philippe Perdu, D. Lewis
Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2003, v:43, n:9-11, pp:1639-1644 [Journal] - T. Beauchêne, D. Lewis, Felix Beaudoin, V. Pouget, Romain Desplats, P. Fouillat, Philippe Perdu, M. Bafleur, D. Trémouilles
Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2003, v:43, n:3, pp:439-444 [Journal] - Kevin Sanchez, Romain Desplats, G. Perez, V. Pichetto, Felix Beaudoin, Philippe Perdu
Solar Cell Analysis with Light Emission and OBIC Techniques. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2003, v:43, n:9-11, pp:1755-1760 [Journal] - Romain Desplats, A. Eral, Felix Beaudoin, Philippe Perdu, Alan J. Weger, Moyra K. McManus, Peilin Song, Franco Stellari
Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2003, v:43, n:9-11, pp:1663-1668 [Journal] - Felix Beaudoin, Kevin Sanchez, Romain Desplats, Philippe Perdu, J. M. Nicot, J. P. Roux, M. Otte
Dynamic Laser Stimulation Case Studies. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2005, v:45, n:9-11, pp:1538-1543 [Journal] - M. Remmach, A. Pigozzi, Romain Desplats, Philippe Perdu, D. Lewis, J. Noel, S. Dudit
Light Emission to Time Resolved Emission For IC Debug and Failure Analysis. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2005, v:45, n:9-11, pp:1476-1481 [Journal] - C. De Nardi, Romain Desplats, Philippe Perdu, Felix Beaudoin, J.-L. Gauffier
Oxide charge measurements in EEPROM devices. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2005, v:45, n:9-11, pp:1514-1519 [Journal] - D. Briand, Felix Beaudoin, J. Courbat, N. F. de Rooij, Romain Desplats, Philippe Perdu
Failure analysis of micro-heating elements suspended on thin membranes. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2005, v:45, n:9-11, pp:1786-1789 [Journal] - Kevin Sanchez, Romain Desplats, Felix Beaudoin, Philippe Perdu, J. P. Roux, G. Woods, D. Lewis
NIR laser stimulation for dynamic timing analysis. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2005, v:45, n:9-11, pp:1459-1464 [Journal] - C. De Nardi, Romain Desplats, Philippe Perdu, J.-L. Gauffier, C. Guérin
Descrambling and data reading techniques for flash-EEPROM memories. Application to smart cards. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2006, v:46, n:9-11, pp:1569-1574 [Journal]
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