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Yi-Chin Chu: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Piero Franco, Siyad C. Ma, Jonathan Chang, Yi-Chin Chu, Sanjay Wattal, Edward J. McCluskey, Robert L. Stokes, William D. Farwell
    Analysis and Detection of Timing Failures in an Experimental Test Chip. [Citation Graph (0, 0)][DBLP]
    ITC, 1996, pp:691-700 [Conf]
  2. Jonathan T.-Y. Chang, Chao-Wen Tseng, Yi-Chin Chu, Sanjay Wattal, Mike Purtell, Edward J. McCluskey
    Experimental Results for IDDQ and VLV Testing. [Citation Graph (0, 0)][DBLP]
    VTS, 1998, pp:118-125 [Conf]

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