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Lee Song:
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- John Gatej, Lee Song, Carol Pyron, Rajesh Raina, Tom Munns
valuating ATE Features in Terms of Test Escape Rates and Other Cost of Test Culprits. [Citation Graph (0, 0)][DBLP] ITC, 2002, pp:1040-1049 [Conf]
- Bill Bottoms, Lee Song, Paul Patton, Wilhelm Radermacher
A Successful DFT Tester: What Will It Look Like? Is DFT Tester a Logical Next Step in ATE Evolution? [Citation Graph (0, 0)][DBLP] VTS, 2002, pp:129-132 [Conf]
- Adam Osseiran, William De Wilkins, Barry Baril, Sassan Tabatabaei, Fidel Muradali, Ken Posse, Lee Song
Analog and Mixed Signal BIST: Too Much, Too Little, Too Late? [Citation Graph (0, 0)][DBLP] VTS, 2002, pp:175-176 [Conf]
- Lee Song, Rudy Garcia, Andrew Levy, Donald L. Wheater
A Successful DFT Tester: What Will It Look Like? Is Revolution in Test Approaches Required? [Citation Graph (0, 0)][DBLP] VTS, 2002, pp:87-90 [Conf]
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