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Publications of Author

1. Xinli Gu, Sung Soo Chung, Frank Tsang, Jan Arild Tofte, Hamid Rahmanian
   An effort-minimized logic BIST implementation method. [Citation Graph (0, 0)][DBLP]
   ITC, 2001, pp:1002-1010 [Conf]
   
2. Xinli Gu, Krzysztof Kuchcinski, Zebo Peng
   An Efficient and Economic Partitioning Approach for Testability. [Citation Graph (0, 0)][DBLP]
   ITC, 1995, pp:403-412 [Conf]
   
3. Xinli Gu, Cyndee Wang, Abby Lee, Bill Eklow, Kun-Han Tsai, Jan Arild Tofte, Mark Kassab, Janusz Rajski
   Realizing High Test Quality Goals with Smart Test Resource Usage. [Citation Graph (0, 0)][DBLP]
   ITC, 2004, pp:525-533 [Conf]
   
4. Xinli Gu, Weili Wang, Kevin Li, Heon C. Kim, Sung Soo Chung
   Re-Using DFT Logic for Functional and Silicon Debugging Test. [Citation Graph (0, 0)][DBLP]
   ITC, 2002, pp:648-656 [Conf]
   
5. Mokhtar Hirech, James Beausang, Xinli Gu
   A new approach to scan chain reordering using physical design information. [Citation Graph (0, 0)][DBLP]
   ITC, 1998, pp:348-0 [Conf]
   
6. Heon C. Kim, Hong Shin Jun, Xinli Gu, Sung Soo Chung
   At-Speed Interconnect Test and Diagnosis of External Memories on a System. [Citation Graph (0, 0)][DBLP]
   ITC, 2004, pp:156-162 [Conf]
   
7. Xinli Gu
   RT level testability-driven partitioning. [Citation Graph (0, 0)][DBLP]
   VTS, 1995, pp:176-183 [Conf]
   
8. 
   A controller testability analysis and enhancement technique. [Citation Graph (, )][DBLP]
   
   
9. 
   Testability analysis and improvement from VHDL behavioral specifications. [Citation Graph (, )][DBLP]
   
   
10. 
    VirtualScan: Test Compression Technology Using Combinational Logic and One-Pass ATPG. [Citation Graph (, )][DBLP]