Peter Hansen Converting Device Test Vectors to an In-Circuit Board Test Environment. [Citation Graph (0, 0)][DBLP] ITC, 1985, pp:972-979 [Conf]
Peter Hansen Testing Conventional Logic and Memory Clusters Using Boundary Scan Devices as Virtual ATE Channels. [Citation Graph (0, 0)][DBLP] ITC, 1989, pp:166-173 [Conf]
Spherical Diffusion for Scale-Invariant Keypoint Detection in Wide-Angle Images. [Citation Graph (, )][DBLP]