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Peter Harrod:
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- Peter Harrod
Testing reusable IP-a case study. [Citation Graph (0, 0)][DBLP] ITC, 1999, pp:493-498 [Conf]
- Michael G. Wahl, Sudipta Bhawmik, Kamran Zarrineh, Pradipta Ghosh, Scott Davidson, Peter Harrod
The P1500 DFT Disclosure Document: A Standard to Communicate Mergeable Core DFT Data. [Citation Graph (0, 0)][DBLP] ITC, 2003, pp:998-1007 [Conf]
- Robin Saxby, Peter Harrod
Test in the Emerging Intellectual Property Business. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 1999, v:16, n:1, pp:16-18 [Journal]
- Noohul Basheer Zain Ali, Mark Zwolinski, Bashir M. Al-Hashimi, Peter Harrod
Dynamic Voltage Scaling Aware Delay Fault Testing. [Citation Graph (0, 0)][DBLP] European Test Symposium, 2006, pp:15-20 [Conf]
Test cost reduction for multiple-voltage designs with bridge defects through Gate-Sizing. [Citation Graph (, )][DBLP]
A New Approach for Transient Fault Injection Using Symbolic Simulation. [Citation Graph (, )][DBLP]
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