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Abu S. M. Hassan: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]
Publications of Author
- Abu S. M. Hassan, Vinod K. Agarwal, Janusz Rajski
Testing and Diagnosis of Interconnects Using Boundary Scan Architecture. [Citation Graph (0, 0)][DBLP]
ITC, 1988, pp:126-137 [Conf] - Abu S. M. Hassan, Vinod K. Agarwal, Janusz Rajski, Benoit Nadeau-Dostie
Testing of Glue Logic Interconnects Using Boundary Scan Architecture. [Citation Graph (0, 0)][DBLP]
ITC, 1989, pp:700-711 [Conf] - Graham Hetherington, Tony Fryars, Nagesh Tamarapalli, Mark Kassab, Abu S. M. Hassan, Janusz Rajski
Logic BIST for large industrial designs: real issues and case studies. [Citation Graph (0, 0)][DBLP]
ITC, 1999, pp:358-367 [Conf] - Benoit Nadeau-Dostie, Dwayne Burek, Abu S. M. Hassan
ScanBIST: A Multi-frequency Scan-based BIST Method. [Citation Graph (0, 0)][DBLP]
ITC, 1992, pp:506-513 [Conf] - Benoit Nadeau-Dostie, Dwayne Burek, Abu S. M. Hassan
ScanBist: A Multifrequency Scan-Based BIST Method. [Citation Graph (0, 0)][DBLP]
IEEE Design & Test of Computers, 1994, v:11, n:1, pp:7-17 [Journal] - Abu S. M. Hassan, Vinod K. Agarwal, Benoit Nadeau-Dostie, Janusz Rajski
BIST of PCB interconnects using boundary-scan architecture. [Citation Graph (0, 0)][DBLP]
IEEE Trans. on CAD of Integrated Circuits and Systems, 1992, v:11, n:10, pp:1278-1288 [Journal]
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