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Klaus Helmreich: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Klaus Helmreich
    Test path simulation and characterisation. [Citation Graph (0, 0)][DBLP]
    ITC, 2001, pp:415-423 [Conf]
  2. Klaus Helmreich, Peter Nagel, Werner Wolz, Klaus D. Müller-Glaser
    An Approach to Chip-Internal Current Monitoring and Measurement Using an Electron Beam Tester. [Citation Graph (0, 0)][DBLP]
    ITC, 1991, pp:256-262 [Conf]
  3. Klaus Helmreich, G. Reinwardt
    Virtual Test of Noise and Jitter Parameters. [Citation Graph (0, 0)][DBLP]
    ITC, 1996, pp:461-470 [Conf]
  4. R. Scharf, C. Kuntzsch, Klaus Helmreich, Werner Wolz, Klaus D. Müller-Glaser
    DRC-based Selection of Optimal Probing Points for Chip-Internal Measurements. [Citation Graph (0, 0)][DBLP]
    ITC, 1992, pp:840-847 [Conf]

  5. A novel approach to entirely integrate Virtual Test into test development flow. [Citation Graph (, )][DBLP]


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