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Kenneth P. Parker: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Bill Eklow, Carl Barnhart, Kenneth P. Parker
    IEEE P1149.6: A Boundary-Scan Standard for Advanced Digital Networks. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:1056-1065 [Conf]
  2. Kathy Hird, Kenneth P. Parker, Bill Follis
    Test Coverage: What Does It Mean When a Board Test Passes?. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:1066-1074 [Conf]
  3. Young Kim, Benny Lai, Kenneth P. Parker, Jeff Rearick
    Frequency detection-based boundary-scan testing of AC coupled nets. [Citation Graph (0, 0)][DBLP]
    ITC, 2001, pp:46-53 [Conf]
  4. Kenneth P. Parker
    System issues in boundary-scan board test. [Citation Graph (0, 0)][DBLP]
    ITC, 2000, pp:724-728 [Conf]
  5. Kenneth P. Parker
    Board Test Is NOT Mature. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:1238- [Conf]
  6. Kenneth P. Parker
    Defect Coverage of Boundary-Scan Tests: What does it mean when a Boundary-Scan test passes?. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:1268-1276 [Conf]
  7. Kenneth P. Parker
    A New Probing Technique for High-Speed/High-Density Printed Circuit Boards. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:365-374 [Conf]
  8. Kenneth P. Parker
    Board Test Coverage Needs to be Standardized. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:1426- [Conf]
  9. Kenneth P. Parker
    Observations on the 1149.x Family of Standards. [Citation Graph (0, 0)][DBLP]
    ITC, 1994, pp:1023- [Conf]
  10. Kenneth P. Parker
    Introduction ITC 1996 Lecture Series on Unpowered Opens Testing. [Citation Graph (0, 0)][DBLP]
    ITC, 1996, pp:924- [Conf]
  11. Kenneth P. Parker, David Greene
    The ITC Lecture Series: An Experiment. [Citation Graph (0, 0)][DBLP]
    ITC, 1995, pp:925- [Conf]
  12. Kenneth P. Parker, John E. McDermid, Rodney A. Browen, Kozo Nuriya, Katsuhiro Hirayama, Akira Matsuzawa
    Design, Fabrications and Use of Mixed-Signal IC Testability Structures. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:489-498 [Conf]
  13. Kenneth P. Parker, John E. McDermid, Stig Oresjo
    Structure and Metrology for an Analog Testability Bus. [Citation Graph (0, 0)][DBLP]
    ITC, 1993, pp:309-322 [Conf]
  14. Mick Tegethoff, Kenneth P. Parker, Ken Lee
    Opens Board Test Coverage: When is 99% Really 40%? [Citation Graph (0, 0)][DBLP]
    ITC, 1996, pp:333-339 [Conf]
  15. Bill Eklow, Carl Barnhart, Kenneth P. Parker
    IEEE 1149.6: A Boundary-Scan Standard for Advanced Digital Networks. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2003, v:20, n:5, pp:76-83 [Journal]
  16. Kenneth P. Parker
    Testing for what? [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2003, v:20, n:2, pp:96-0 [Journal]
  17. Mick Tegethoff, Kenneth P. Parker
    IEEE Std 1149.1: Where Are We? Where From Here? [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1995, v:12, n:2, pp:53-59 [Journal]
  18. Edward J. McCluskey, Kenneth P. Parker, John J. Shedletsky
    Boolean Network Probabilities and Network Design. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1978, v:27, n:2, pp:187-189 [Journal]
  19. Kenneth P. Parker, Edward J. McCluskey
    Probabilistic Treatment of General Combinational Networks. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1975, v:24, n:6, pp:668-670 [Journal]
  20. Kenneth P. Parker, Edward J. McCluskey
    Analysis of Logic Circuits with Faults Using Input Signal Probabilities. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1975, v:24, n:5, pp:573-578 [Journal]
  21. Kenneth P. Parker, Edward J. McCluskey
    Sequential Circuit Output Probabilities From Regular Expressions. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1978, v:27, n:3, pp:222-231 [Journal]
  22. Thomas W. Williams, Kenneth P. Parker
    Design for Testability - A Survey. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1982, v:31, n:1, pp:2-15 [Journal]

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