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Kenneth P. Parker :
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Bill Eklow , Carl Barnhart , Kenneth P. Parker IEEE P1149.6: A Boundary-Scan Standard for Advanced Digital Networks. [Citation Graph (0, 0)][DBLP ] ITC, 2002, pp:1056-1065 [Conf ] Kathy Hird , Kenneth P. Parker , Bill Follis Test Coverage: What Does It Mean When a Board Test Passes?. [Citation Graph (0, 0)][DBLP ] ITC, 2002, pp:1066-1074 [Conf ] Young Kim , Benny Lai , Kenneth P. Parker , Jeff Rearick Frequency detection-based boundary-scan testing of AC coupled nets. [Citation Graph (0, 0)][DBLP ] ITC, 2001, pp:46-53 [Conf ] Kenneth P. Parker System issues in boundary-scan board test. [Citation Graph (0, 0)][DBLP ] ITC, 2000, pp:724-728 [Conf ] Kenneth P. Parker Board Test Is NOT Mature. [Citation Graph (0, 0)][DBLP ] ITC, 2002, pp:1238- [Conf ] Kenneth P. Parker Defect Coverage of Boundary-Scan Tests: What does it mean when a Boundary-Scan test passes?. [Citation Graph (0, 0)][DBLP ] ITC, 2003, pp:1268-1276 [Conf ] Kenneth P. Parker A New Probing Technique for High-Speed/High-Density Printed Circuit Boards. [Citation Graph (0, 0)][DBLP ] ITC, 2004, pp:365-374 [Conf ] Kenneth P. Parker Board Test Coverage Needs to be Standardized. [Citation Graph (0, 0)][DBLP ] ITC, 2004, pp:1426- [Conf ] Kenneth P. Parker Observations on the 1149.x Family of Standards. [Citation Graph (0, 0)][DBLP ] ITC, 1994, pp:1023- [Conf ] Kenneth P. Parker Introduction ITC 1996 Lecture Series on Unpowered Opens Testing. [Citation Graph (0, 0)][DBLP ] ITC, 1996, pp:924- [Conf ] Kenneth P. Parker , David Greene The ITC Lecture Series: An Experiment. [Citation Graph (0, 0)][DBLP ] ITC, 1995, pp:925- [Conf ] Kenneth P. Parker , John E. McDermid , Rodney A. Browen , Kozo Nuriya , Katsuhiro Hirayama , Akira Matsuzawa Design, Fabrications and Use of Mixed-Signal IC Testability Structures. [Citation Graph (0, 0)][DBLP ] ITC, 1997, pp:489-498 [Conf ] Kenneth P. Parker , John E. McDermid , Stig Oresjo Structure and Metrology for an Analog Testability Bus. [Citation Graph (0, 0)][DBLP ] ITC, 1993, pp:309-322 [Conf ] Mick Tegethoff , Kenneth P. Parker , Ken Lee Opens Board Test Coverage: When is 99% Really 40%? [Citation Graph (0, 0)][DBLP ] ITC, 1996, pp:333-339 [Conf ] Bill Eklow , Carl Barnhart , Kenneth P. Parker IEEE 1149.6: A Boundary-Scan Standard for Advanced Digital Networks. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 2003, v:20, n:5, pp:76-83 [Journal ] Kenneth P. Parker Testing for what? [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 2003, v:20, n:2, pp:96-0 [Journal ] Mick Tegethoff , Kenneth P. Parker IEEE Std 1149.1: Where Are We? Where From Here? [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1995, v:12, n:2, pp:53-59 [Journal ] Edward J. McCluskey , Kenneth P. Parker , John J. Shedletsky Boolean Network Probabilities and Network Design. [Citation Graph (0, 0)][DBLP ] IEEE Trans. Computers, 1978, v:27, n:2, pp:187-189 [Journal ] Kenneth P. Parker , Edward J. McCluskey Probabilistic Treatment of General Combinational Networks. [Citation Graph (0, 0)][DBLP ] IEEE Trans. Computers, 1975, v:24, n:6, pp:668-670 [Journal ] Kenneth P. Parker , Edward J. McCluskey Analysis of Logic Circuits with Faults Using Input Signal Probabilities. [Citation Graph (0, 0)][DBLP ] IEEE Trans. Computers, 1975, v:24, n:5, pp:573-578 [Journal ] Kenneth P. Parker , Edward J. McCluskey Sequential Circuit Output Probabilities From Regular Expressions. [Citation Graph (0, 0)][DBLP ] IEEE Trans. Computers, 1978, v:27, n:3, pp:222-231 [Journal ] Thomas W. Williams , Kenneth P. Parker Design for Testability - A Survey. [Citation Graph (0, 0)][DBLP ] IEEE Trans. Computers, 1982, v:31, n:1, pp:2-15 [Journal ] Search in 0.002secs, Finished in 0.003secs