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Publications of Author

1. Camelia Hora, Rene Segers, Stefan Eichenberger, Maurice Lousberg
   An Effective Diagnosis Method to Support Yield Improvement. [Citation Graph (0, 0)][DBLP]
   ITC, 2002, pp:260-269 [Conf]
   
2. Bram Kruseman, Ananta K. Majhi, Camelia Hora, Stefan Eichenberger, Johan Meirlevede
   Systematic Defects in Deep Sub-Micron Technologies. [Citation Graph (0, 0)][DBLP]
   ITC, 2004, pp:290-299 [Conf]
   
3. Bart Vermeulen, Camelia Hora, Bram Kruseman, Erik Jan Marinissen, Robert Van Rijsinge
   Trends in Testing Integrated Circuits. [Citation Graph (0, 0)][DBLP]
   ITC, 2004, pp:688-697 [Conf]
   
4. Xinyue Fan, Will Moore, Camelia Hora, Mario H. Konijnenburg, Guido Gronthoud
   A Gate-Level Method for Transistor-Level Bridging Fault Diagnosis. [Citation Graph (0, 0)][DBLP]
   VTS, 2006, pp:266-271 [Conf]
   
5. Ananta K. Majhi, Guido Gronthoud, Camelia Hora, Maurice Lousberg, Pop Valer, Stefan Eichenberger
   Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model. [Citation Graph (0, 0)][DBLP]
   VTS, 2003, pp:345-350 [Conf]
   
6. D. Arumi, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi
   Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages. [Citation Graph (0, 0)][DBLP]
   VTS, 2007, pp:145-150 [Conf]
   
7. Rosa Rodríguez-Montañés, D. Arumi, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi
   Diagnosis of Full Open Defects in Interconnecting Lines. [Citation Graph (0, 0)][DBLP]
   VTS, 2007, pp:158-166 [Conf]
   
8. 
   Impact of Temperature on Test Quality. [Citation Graph (, )][DBLP]
   
   
9. 
   Full Open Defects in Nanometric CMOS. [Citation Graph (, )][DBLP]
   
   
10. 
    Diagnosis of full open defects in interconnect lines with fan-out. [Citation Graph (, )][DBLP]