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Masato Kawai: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Masato Kawai, T. Shimono, S. Funatsu
    Test Data Quality Assurance. [Citation Graph (0, 0)][DBLP]
    ITC, 1986, pp:848-852 [Conf]
  2. Masato Kawai, H. Shibano, S. Funatsu, S. Kato, T. Kurobe, K. Ookawa, T. Sasaki
    A High Level Test Pattern Generation Algorithm. [Citation Graph (0, 0)][DBLP]
    ITC, 1983, pp:346-353 [Conf]
  3. T. Noguchi, Atsushi Murakami, Masato Kawai, Y. Hayasaka
    Testing for a Solid-State Color Image Sensor. [Citation Graph (0, 0)][DBLP]
    ITC, 1986, pp:683-687 [Conf]
  4. T. Shimono, K. Oozeki, M. Takahashi, Masato Kawai, S. Funatsu
    An AC/DC Test Generation System for Gate Array LSIs. [Citation Graph (0, 0)][DBLP]
    ITC, 1985, pp:329-333 [Conf]
  5. Shigeru Takasaki, Masato Kawai, S. Funatsu, Akihiko Yamoda
    A Calculus of Testability Measure at the Functional Level. [Citation Graph (0, 0)][DBLP]
    ITC, 1981, pp:95-101 [Conf]
  6. Hidetoshi Tanaka, Masato Kawai, Izumi Sugasaki, Tadanobu Hakuba
    System Level Fault Dictionary Generation. [Citation Graph (0, 0)][DBLP]
    ITC, 1988, pp:884-887 [Conf]

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