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Ryozou Yoshino: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Shuji Kikuchi, Yoshihiko Hayashi, Takashi Matsumoto, Ryozou Yoshino, Ryuichi Takagi
    A 250 MHz Shared-Resource VLSI Test System with High Pin Count and Memory Test Capability. [Citation Graph (0, 0)][DBLP]
    ITC, 1989, pp:558-566 [Conf]
  2. Shuji Kikuchi, Yoshihiko Hayashi, Takashi Suga, Jun Saitou, Masahiko Kaneko, Takashi Matsumoto, Ryozou Yoshino
    A Gate-Array-Based 666MHz VLSI Test System. [Citation Graph (0, 0)][DBLP]
    ITC, 1995, pp:451-458 [Conf]
  3. Ryozou Yoshino, Ryuichi Takagi
    Custom VLSI Test System. [Citation Graph (0, 0)][DBLP]
    ITC, 1985, pp:431-437 [Conf]

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