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Hyungwon Kim: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]
Publications of Author
- Hyungwon Kim, John P. Hayes
High-coverage ATPG for datapath circuits with unimplemented blocks. [Citation Graph (0, 0)][DBLP]
ITC, 1998, pp:577-586 [Conf] - Hyungwon Kim, John P. Hayes
Delay fault testing of IP-based designs via symbolic path modeling. [Citation Graph (0, 0)][DBLP]
ITC, 1999, pp:1045-1054 [Conf] - Hyungwon Kim, John P. Hayes
Delay Fault Testing of Designs with Embedded IP Cores. [Citation Graph (0, 0)][DBLP]
VTS, 1999, pp:160-167 [Conf] - Hyungwon Kim, John P. Hayes
Realization-independent ATPG for designs with unimplemented blocks. [Citation Graph (0, 0)][DBLP]
IEEE Trans. on CAD of Integrated Circuits and Systems, 2001, v:20, n:2, pp:290-306 [Journal] - Hyungwon Kim, John P. Hayes
Delay fault testing of IP-based designs via symbolic path modeling. [Citation Graph (0, 0)][DBLP]
IEEE Trans. VLSI Syst., 2001, v:9, n:5, pp:661-678 [Journal]
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