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David P. Vallett: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Daniel R. Knebel, Pia Sanda, Moyra K. McManus, Jeffrey A. Kash, James C. Tsang, David P. Vallett, Leendert M. Huisman, Phil Nigh, Rick Rizzolo, Peilin Song, Franco Motika
    Diagnosis and characterization of timing-related defects by time-dependent light emission. [Citation Graph (0, 0)][DBLP]
    ITC, 1998, pp:733-739 [Conf]
  2. Phil Nigh, David P. Vallett, Atul Patel, Jason Wright
    Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment. [Citation Graph (0, 0)][DBLP]
    ITC, 1998, pp:43-0 [Conf]
  3. Phil Nigh, David P. Vallett, Atul Patel, Jason Wright, Franco Motika, Donato Forlenza, Ray Kurtulik, Wendy Chong
    Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment. [Citation Graph (0, 0)][DBLP]
    ITC, 1999, pp:1152-1161 [Conf]
  4. David P. Vallett
    An Overview of CMOS VLSI Failure Analysis and the Importance of Test and Diagnostics. [Citation Graph (0, 0)][DBLP]
    ITC, 1996, pp:930- [Conf]
  5. David P. Vallett
    IC Failure Analysis: The Importance of Test and Diagnostics. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1997, v:14, n:3, pp:76-82 [Journal]
  6. James C. Tsang, Jeffrey A. Kash, David P. Vallett
    Picosecond imaging circuit analysis. [Citation Graph (0, 0)][DBLP]
    IBM Journal of Research and Development, 2000, v:44, n:4, pp:583-604 [Journal]

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