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Peter Janssen: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Bram Kruseman, Peter Janssen, Victor Zieren
    Transient current testing of 0.25 /spl mu/m CMOS devices. [Citation Graph (0, 0)][DBLP]
    ITC, 1999, pp:47-56 [Conf]
  2. Manoj Sachdev, Peter Janssen, Victor Zieren
    Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs. [Citation Graph (0, 0)][DBLP]
    ITC, 1998, pp:204- [Conf]

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