The SCEAS System
Navigation Menu
Introduction
Collection Based
Clustering
Ranking
Paper Based
Journals
Conferences
DB Status
Statistics
Search

Search the dblp DataBase

Title:
Author:
Peter C. Maxwell: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Peter C. Maxwell
    The Heisenberg Uncertainty of Test. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:13- [Conf]
  2. Peter C. Maxwell
    Wafer/Package Test Mix for Optimal Defect Detection. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:1050-1055 [Conf]
  3. Peter C. Maxwell
    The Interaction of Test and Quality. [Citation Graph (0, 0)][DBLP]
    ITC, 1991, pp:1120- [Conf]
  4. Peter C. Maxwell
    Let's Grade ALL the Faults. [Citation Graph (0, 0)][DBLP]
    ITC, 1993, pp:595- [Conf]
  5. Peter C. Maxwell
    The Many Faces of Test Synthesis. [Citation Graph (0, 0)][DBLP]
    ITC, 1995, pp:295- [Conf]
  6. Peter C. Maxwell, Robert C. Aitken
    Biased Voting: A Method for Simulating CMOS Bridging Faults in the Presence of Variable Gate Logic. [Citation Graph (0, 0)][DBLP]
    ITC, 1993, pp:63-72 [Conf]
  7. Peter C. Maxwell, Robert C. Aitken, Leendert M. Huisman
    The Effect on Quality of Non-Uniform Fault Coverage and Fault Probability. [Citation Graph (0, 0)][DBLP]
    ITC, 1994, pp:739-746 [Conf]
  8. Peter C. Maxwell, Robert C. Aitken, Vic Johansen, Inshen Chiang
    The Effect of Different Test Sets on Quality Level Prediction: When is 80% better than 90%? [Citation Graph (0, 0)][DBLP]
    ITC, 1991, pp:358-364 [Conf]
  9. Peter C. Maxwell, Robert C. Aitken, Vic Johansen, Inshen Chiang
    The Effectiveness of IDDQ, Functional and Scan Tests: How Many Fault Coverages Do We Need? [Citation Graph (0, 0)][DBLP]
    ITC, 1992, pp:168-177 [Conf]
  10. Peter C. Maxwell, Robert C. Aitken, Kathleen R. Kollitz, Allen C. Brown
    IDDQ and AC Scan: The War Against Unmodelled Defects. [Citation Graph (0, 0)][DBLP]
    ITC, 1996, pp:250-258 [Conf]
  11. Peter C. Maxwell, Ismed Hartanto, Lee Bentz
    Comparing functional and structural tests. [Citation Graph (0, 0)][DBLP]
    ITC, 2000, pp:400-407 [Conf]
  12. Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman
    Current ratios: a self-scaling technique for production IDDQ testing. [Citation Graph (0, 0)][DBLP]
    ITC, 2000, pp:1148-1156 [Conf]
  13. Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman
    Current ratios: a self-scaling technique for production I_DDQ testing. [Citation Graph (0, 0)][DBLP]
    ITC, 1999, pp:738-746 [Conf]
  14. Peter C. Maxwell, Jeff Rearick
    Deception by design: fooling ourselves with gate-level models. [Citation Graph (0, 0)][DBLP]
    ITC, 2000, pp:921-929 [Conf]
  15. Peter C. Maxwell, Jeff Rearick
    Estimation of defect-free IDDQ in submicron circuits using switch level simulation. [Citation Graph (0, 0)][DBLP]
    ITC, 1998, pp:882-889 [Conf]
  16. Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly
    So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:1037-1038 [Conf]
  17. Alan W. Righter, Charles F. Hawkins, Jerry M. Soden, Peter C. Maxwell
    CMOS IC reliability indicators and burn-in economics. [Citation Graph (0, 0)][DBLP]
    ITC, 1998, pp:194-203 [Conf]
  18. Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken
    An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. [Citation Graph (0, 0)][DBLP]
    VTS, 1997, pp:459- [Conf]
  19. Peter C. Maxwell
    The use of IDDQ testing in low stuck-at coverage situations. [Citation Graph (0, 0)][DBLP]
    VTS, 1995, pp:84-88 [Conf]
  20. Peter C. Maxwell, Steve Baird, Wayne M. Needham, Al Crouch, Phil Nigh
    Best Methods for At-Speed Testing? [Citation Graph (0, 0)][DBLP]
    VTS, 1998, pp:460-461 [Conf]
  21. Edward J. McCluskey, Subhasish Mitra, Bob Madge, Peter C. Maxwell, Phil Nigh, Mike Rodgers
    Debating the Future of Burn-In. [Citation Graph (0, 0)][DBLP]
    VTS, 2002, pp:311-314 [Conf]
  22. Peter C. Maxwell, P. W. Baker, Philip G. McCrea
    Incremental Computer Systems. [Citation Graph (0, 0)][DBLP]
    Australian Computer Journal, 1976, v:8, n:3, pp:97-102 [Journal]
  23. Peter C. Maxwell
    Wafer-Package Test Mix for Optimal Defect Detection and Test Time Savings. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2003, v:20, n:5, pp:84-89 [Journal]
  24. Peter C. Maxwell, Robert C. Aitken
    Test Sets and Reject Rates: All Fault Coverages are Not Created Equal. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1993, v:10, n:1, pp:42-51 [Journal]
  25. Jaume Segura, Peter C. Maxwell
    Guest Editors' Introduction: Defect-Oriented Testing in the Deep-Submicron Era. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2002, v:19, n:5, pp:5-7 [Journal]
  26. Peter C. Maxwell
    Correct DDA Register Transfers for Trapezoidal Integration When Solving Nonlinear Equations of the Form y = A yn. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1977, v:26, n:11, pp:1151-1153 [Journal]
  27. Peter C. Maxwell
    Comparative Analysis of Different Implementations of Multiple-Input Signature Analyzers. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1988, v:37, n:11, pp:1411-1414 [Journal]
  28. Philip G. McCrea, Peter C. Maxwell, P. W. Baker
    Comments on ``A Floating Point Multiplexed DDA System''. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1978, v:27, n:12, pp:1226- [Journal]
  29. Peter C. Maxwell
    Reductions in quality caused by uneven fault coverage of different areas of an integrated circuit. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1995, v:14, n:5, pp:603-607 [Journal]

  30. The effectiveness of different test sets for PLAs. [Citation Graph (, )][DBLP]


Search in 0.002secs, Finished in 0.307secs
NOTICE1
System may not be available sometimes or not working properly, since it is still in development with continuous upgrades
NOTICE2
The rankings that are presented on this page should NOT be considered as formal since the citation info is incomplete in DBLP
 
Introduction Collection Based Clustering Ranking Paper Based Journals Conferences DB Status Statistics Search
System created by asidirop@csd.auth.gr [http://users.auth.gr/~asidirop/] © 2002
for Data Engineering Laboratory, Department of Informatics, Aristotle University © 2002