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Ritesh P. Turakhia: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler
    In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:203-212 [Conf]
  2. Ritesh P. Turakhia, Brady Benware, Robert Madge, Thaddeus T. Shannon, W. Robert Daasch
    Defect Screening Using Independent Component Analysis on I_DDQ. [Citation Graph (0, 0)][DBLP]
    VTS, 2005, pp:427-432 [Conf]
  3. Ritesh P. Turakhia, W. Robert Daasch, Joel Lurkins, Brady Benware
    Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:2, pp:100-109 [Journal]

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